Non-destructive statistical analysis of embedded nanoparticles by X-ray diffraction imaging

2011 ◽  
Vol 64 (7) ◽  
pp. 613-616 ◽  
Author(s):  
D. Pelliccia ◽  
A.Y. Nikulin ◽  
B.C. Muddle ◽  
O. Sakata
Keyword(s):  
Statistical Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Imaging ◽  
Embedded Nanoparticles ◽  
Non Destructive

scholarly journals X-ray fan beam coded aperture transmission and diffraction imaging for fast material analysis

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Stefan Stryker ◽  
Joel A. Greenberg ◽  
Shannon J. McCall ◽  
Anuj J. Kapadia
Keyword(s):  
High Resolution ◽  
Spatial Resolution ◽  
Imaging System ◽  
Coded Aperture ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Imaging ◽  
Diffraction Imaging ◽  
Non Destructive ◽  
Ray Methods

AbstractX-ray transmission imaging has been used in a variety of applications for high-resolution measurements based on shape and density. Similarly, X-ray diffraction (XRD) imaging has been used widely for molecular structure-based identification of materials. Combining these X-ray methods has the potential to provide high-resolution material identification, exceeding the capabilities of either modality alone. However, XRD imaging methods have been limited in application by their long measurement times and poor spatial resolution, which has generally precluded combined, rapid measurements of X-ray transmission and diffraction. In this work, we present a novel X-ray fan beam coded aperture transmission and diffraction imaging system, developed using commercially available components, for rapid and accurate non-destructive imaging of industrial and biomedical specimens. The imaging system uses a 160 kV Bremsstrahlung X-ray source while achieving a spatial resolution of ≈ 1 × 1 mm2 and a spectral accuracy of > 95% with only 15 s exposures per 150 mm fan beam slice. Applications of this technology are reported in geological imaging, pharmaceutical inspection, and medical diagnosis. The performance of the imaging system indicates improved material differentiation relative to transmission imaging alone at scan times suitable for a variety of industrial and biomedical applications.

Development of a novel apparatus for experiments in soft X-ray diffraction imaging and diffraction tomography

2003 ◽  
Vol 104 ◽  
pp. 27-30 ◽  
Author(s):  
T. Beetz ◽  
C. Jacobsen ◽  
C.-C. Kao ◽  
J. Kirz ◽  
O. Mentes ◽  
...  
Keyword(s):  
Diffraction Tomography ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Imaging

Highlights in the history of X-ray topography1

1995 ◽  
Vol 210 (6) ◽  
Author(s):  
A. R. Lang
Keyword(s):  
Magnetic Domain ◽  
Diffraction Theory ◽  
Dislocation Loops ◽  
X Ray Diffraction ◽  
X Ray ◽  
Domain Structures ◽  
Structure Factors ◽  
History Of ◽  
Dislocation Sources ◽  
Non Destructive

AbstractX-ray topography provides a non-destructive method of mapping point-by-point variations in orientation and reflecting power within crystals. The discovery, made by several workers independently, that in nearly perfect crystals it was possible to detect individual dislocations by X-ray diffraction contrast started an epoch of rapid exploitation of X-ray topography as a new, general method for assessing crystal perfection. Another discovery, that of X-ray Pendellösung, led to important theoretical developments in X-ray diffraction theory and to a new and precise method for measuring structure factors on an absolute scale. Other highlights picked out for mention are studies of Frank-Read dislocation sources, the discovery of long dislocation helices and lines of coaxial dislocation loops in aluminium, of internal magnetic domain structures in Fe-3 wt.% Si, and of stacking faults in silicon and natural diamonds.

scholarly journals Statistical analysis of the reproducibility of residual stress measurements in cold extruded parts

2021 ◽  
Author(s):  
Fabian Jaeger ◽  
Alessandro Franceschi ◽  
Holger Hoche ◽  
Peter Groche ◽  
Matthias Oechsner
Keyword(s):  
Residual Stress ◽  
Statistical Analysis ◽  
Stress Measurement ◽  
Industrial Applications ◽  
Cold Extrusion ◽  
X Ray Diffraction ◽  
Forming Process ◽  
X Ray ◽  
Stress States ◽  
Key Aspects

AbstractCold extruded components are characterized by residual stresses, which originate from the experienced manufacturing process. For industrial applications, reproducibility and homogeneity of the final components are key aspects for an optimized quality control. Although striving to obtain identical deformation and surface conditions, fluctuation in the manufacturing parameters and contact shear conditions during the forming process may lead to variations of the spatial residual stress distribution in the final product. This could lead to a dependency of the residual stress measurement results on the relative axial and circumferential position on the sample. An attempt to examine this problem is made by the employment of design of experiments (DoE) methods. A statistical analysis of the residual stress results generated through X-Ray diffraction is performed. Additionally, the ability of cold extrusion processes to generate uniform stress states is analyzed on specimens of austenitic stainless steel 1.4404 and possible correlations with the pre-deformed condition are statistically examined. Moreover, the influence of the coating, consisting of oxalate and a MoS2 based lubricant, on the X-Ray diffraction measurements of the surface is investigated.

scholarly journals Simultaneous Multi-Bragg Peak Coherent X-ray Diffraction Imaging

Crystals ◽  
2021 ◽  
Vol 11 (3) ◽  
pp. 312
Author(s):  
Florian Lauraux ◽  
Stéphane Labat ◽  
Sarah Yehya ◽  
Marie-Ingrid Richard ◽  
Steven J. Leake ◽  
...  
Keyword(s):  
Bragg Reflection ◽  
Volume Ratio ◽  
X Ray Diffraction ◽  
X Ray ◽  
Crystal Substrate ◽  
In Series ◽  
Diffraction Imaging ◽  
Diffraction Patterns ◽  
Lattice Planes ◽  
Oriented Parallel

The simultaneous measurement of two Bragg reflections by Bragg coherent X-ray diffraction is demonstrated on a twinned Au crystal, which was prepared by the solid-state dewetting of a 30 nm thin gold film on a sapphire substrate. The crystal was oriented on a goniometer so that two lattice planes fulfill the Bragg condition at the same time. The Au 111 and Au 200 Bragg peaks were measured simultaneously by scanning the energy of the incident X-ray beam and recording the diffraction patterns with two two-dimensional detectors. While the former Bragg reflection is not sensitive to the twin boundary, which is oriented parallel to the crystal–substrate interface, the latter reflection is only sensitive to one part of the crystal. The volume ratio between the two parts of the twinned crystal is about 1:9, which is also confirmed by Laue microdiffraction of the same crystal. The parallel measurement of multiple Bragg reflections is essential for future in situ and operando studies, which are so far limited to either a single Bragg reflection or several in series, to facilitate the precise monitoring of both the strain field and defects during the application of external stimuli.

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