Lattice defects related magnetic and magnetocapacitance properties of multiferroic BaFe10.2Sc1.8O19 epitaxial thin films

ABSTRACTWe examined the influence of momentary annealing on the nanoscale surface morphology of NiO(111) epitaxial thin films deposited on atomically stepped sapphire (0001) substrates at room temperature in O2 at 1.3 × 10−3 and 1.3 × 10−6 Pa using a pulsed laser deposition (PLD) technique. The NiO films have atomically flat surfaces (RMS roughness: approximately 0.1–0.2 nm) reflecting the step-and-terrace structures of the substrates, regardless of the O2 deposition pressure. After rapid thermal annealing (RTA) of the NiO(111) epitaxial film deposited at 1.3 × 10−3 Pa O2, a periodic straight nanogroove array related to the atomic steps of the substrate was formed on the film surface for 60 s. In contrast, the fabrication of a transient state in the nanogroove array formation was achieved with RTA of less than 1 s. However, when the O2 atmosphere during PLD was 1.3 × 10−6 Pa, random crystal growth was observed and resulted in a disordered rough surface nanostructure after RTA.

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Pseudomorphic strain effect on the charge-orbital ordering pattern in Pr0.5Sr0.5MnO3 epitaxial thin films

Applied Physics Letters ◽

10.1063/1.1885191 ◽

2005 ◽

Vol 86 (11) ◽

pp. 112513 ◽

Cited By ~ 38

Author(s):

Yasushi Ogimoto ◽

Naoko Takubo ◽

Masao Nakamura ◽

Hiroharu Tamaru ◽

Makoto Izumi ◽

...

Keyword(s):

Thin Films ◽

Strain Effect ◽

Epitaxial Thin Films ◽

Orbital Ordering

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Characterization of Epitaxial Superconducting YBacuO Thin Films with Three Different Orientations

MRS Proceedings ◽

10.1557/proc-169-679 ◽

1989 ◽

Vol 169 ◽

Author(s):

X.K. Wang ◽

D.X. Li ◽

S.N. Song ◽

J.Q. Zheng ◽

R.P.H. Chang ◽

...

Keyword(s):

Thin Films ◽

Critical Current Density ◽

Critical Current ◽

Current Density ◽

Orientation Dependence ◽

Zero Field ◽

Epitaxial Thin Films ◽

Oriented Film ◽

Zero Resistance ◽

Xrd Patterns

AbstractEpitaxial thin films of YBaCuO were prepared by multilayer deposition from Y, Cu, and BaF2 sources with: (1) the a‐axis perpendicular to (100)SrTiO3; (2) the c‐axis perpendicular to (100)SrTiO3; and (3) the [110] axis perpendicular to (110)SrTiO3. XRD patterns as well as SEM and HREM images confirm that the films are highly oriented, essentially epitaxial. Both the a‐axis oriented and the c‐axis oriented films exhibit zero resistance at 91K. The [110] oriented film shows the sharpest transiton with a transition width of IK and zero resistance at 85K. The zero field critical current density, Jc, determined magnetically, is in excess of 107A/cm2 at 4.4K and 1.04 x 106A/cm2 at 77K for the c‐axis oriented film; for the a‐axis oriented film we obtained 6.7 x 106A/cm2 at 4.4K and 1.2 x 105A/cm2 at 77K. The orientation dependence of the critical current density in the basal plane of the a‐axis oriented film was studied. The largest Jc's occur along the in‐plane <100> axes of the substrate.

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