Determination of the Fe layer structure in Fe/Ru superlattices by grazing incidence angle X-ray diffraction

A new and more `generalized' grazing-incidence-angle X-ray diffraction (G-GIXD) method which enables simultaneous measurements both of in- and out-of-plane diffraction images from surface and interface structures has been developed. While the method uses grazing-incidence-angle X-rays like synchrotron radiation as an incident beam in the same manner as in `traditional' GIXD, two-dimensional (area) detectors like image plates and a spherical-type goniometer are used as the data-collection system. In this way, diffraction images both in the Seemann–Bohlin (out-of-plane) and GIXD geometry (in-plane) can be measured simultaneously without scanning the detectors. The method can be applied not only to the analysis of the in-plane crystal structure of epitaxically grown thin films, but also to more general research topics like the structural analysis of polycrystalline mixed phases of thin surface and interface layers.

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Grazing Incidence angle X-ray Diffraction of implanted stainless steel: comparison between simulated data and experimental data

10.1063/1.2401511 ◽

2006 ◽

Author(s):

J. Dudognon ◽

M. Vayer ◽

A. Pineau ◽

R. Erre

Keyword(s):

Experimental Data ◽

Stainless Steel ◽

Incidence Angle ◽

Simulated Data ◽

Grazing Incidence ◽

X Ray Diffraction ◽

X Ray ◽

Grazing Incidence Angle

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Generalized Grazing Incidence-Angle X-Ray Diffraction Studies on InAs Quantum Dots on Si (100) Substrates

Japanese Journal of Applied Physics ◽

10.1143/jjap.39.4483 ◽

2000 ◽

Vol 39 (Part 1, No. 7B) ◽

pp. 4483-4485 ◽

Cited By ~ 9

Author(s):

Takeshi Uragami ◽

Hiroshi Fujioka ◽

Ichitaro Waki ◽

Takaaki Mano ◽

Kanta Ono ◽

...

Keyword(s):

Quantum Dots ◽

Incidence Angle ◽

Grazing Incidence ◽

X Ray Diffraction ◽

Inas Quantum Dots ◽

X Ray ◽

Grazing Incidence Angle

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Thickness of Polycrystalline Copper Coating Measured by X-Ray Diffraction

Solid State Phenomena ◽

10.4028/www.scientific.net/ssp.163.9 ◽

2010 ◽

Vol 163 ◽

pp. 9-12 ◽

Cited By ~ 1

Author(s):

S.J. Skrzypek ◽

M. Goły ◽

J. Kowalska ◽

K. Chruściel

Keyword(s):

Incidence Angle ◽

Grazing Incidence ◽

Thin Layers ◽

Circuit Board ◽

Metallic Films ◽

X Ray Diffraction ◽

X Ray ◽

Thickness Determination ◽

Copper Coatings

Electrodeposition and other methods are employed to obtain metallic films and coatings. Copper coatings are most extensively used in circuit board industry and often as a base to further formation of other metallic films. Electrodeposited copper films (thin layers) are widely used in electronic and automotive industry so its electrical and mechanical properties and its thickness are important. Several methods are used for thickness determination of thin films and coatings for example mechanical, magnetic and ball crater with light microscopy methods. They are destructive and not precise enough. The X-ray fluorescence, absorption and diffraction are more frequently used due to better precision. Although they are complex and expensive, they pronounce an important feature like non-destructive character. For particular cases geometrical conditions and mathematical calculation procedure must be elaborated. An application of X-ray diffraction in grazing incidence angle for thickness determination is described in this article. The method is based on absorption principles of X-ray beam. The absorption is proportional to thickness of the coating and to incidence and to the diffraction angle which. Geometrical conditions were obtained experimentally and suitable mathematical calculations were introduced. The elaborated methodical approach was applied to thickness determination of copper coatings electrodeposited on a brass substrate.

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Structure determination of ultrathin NbSe2 films by Grazing incidence x-ray diffraction

Solid State Communications ◽

10.1016/0038-1098(94)90168-6 ◽

1994 ◽

Vol 89 (7) ◽

pp. 583-586 ◽

Cited By ~ 5

Author(s):

Toshihiro Shimada ◽

Yukito Furukawa ◽

Etsuo Arakawa ◽

Kunikazu Takeshita ◽

Tadashi Matsushita ◽

...

Keyword(s):

Structure Determination ◽

Grazing Incidence ◽

X Ray Diffraction ◽

X Ray

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Toward a Determination of the Critical Size of Ice Nuclei. A Demonstration by Grazing Incidence X-ray Diffraction of Epitaxial Growth of Ice under the C31H63OH Alcohol Monolayer

The Journal of Physical Chemistry ◽

10.1021/j100066a030 ◽

1994 ◽

Vol 98 (15) ◽

pp. 4087-4093 ◽

Cited By ~ 33

Author(s):

J. Majewski ◽

R. Popovitz-Biro ◽

K. Kjaer ◽

J. Als-Nielsen ◽

M. Lahav ◽

...

Keyword(s):

Epitaxial Growth ◽

Critical Size ◽

Grazing Incidence ◽

X Ray Diffraction ◽

X Ray ◽

Ice Nuclei

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Study of a chemical-vapor-deposited diamond thin film on a molybdenum substrate by glancing incidence X-ray diffraction

Powder Diffraction ◽

10.1154/1.2790933 ◽

2007 ◽

Vol 22 (4) ◽

pp. 319-323 ◽

Cited By ~ 1

Author(s):

Jianfeng Fang ◽

Jing Huo ◽

Jinyuan Zhang ◽

Yi Zheng

Keyword(s):

Thin Film ◽

Diffraction Analysis ◽

Transition Layer ◽

Chemical Vapor ◽

Grazing Incidence ◽

X Ray Diffraction ◽

X Ray ◽

Diamond Thin Film ◽

Chemical Vapor Deposited

The structure of a chemical-vapor-deposited (CVD) diamond thin film on a Mo substrate was studied using quasi-parallel X-ray and glancing incidence techniques. Conventional X-ray diffraction analysis revealed that the sample consists of a diamond thin film, a Mo2C transition layer, and Mo substrate. The Mo2C transition layer was formed by a chemical reaction between the diamond film and the Mo substrate during the CVD process. A method for layer-thickness determination of the thin film and the transition layer was developed. This method was based on a relationship between X-ray diffraction intensities from the transition layer or its substrate and a function of grazing incidence angles. Results of glancing incidence X-ray diffraction analysis showed that thicknesses of the diamond thin film and the Mo2C transition layer were determined successfully with high precision.

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