Effects of shallow trench isolation on low frequency noise characteristics of source-follower transistors in CMOS image sensors

2016 ◽  
Vol 119 ◽  
pp. 29-32 ◽  
Author(s):  
Sung-Kyu Kwon ◽  
Hyuk-Min Kwon ◽  
Woon-Il Choi ◽  
Hyeong-Sub Song ◽  
Hi-Deok Lee
Keyword(s):  
Low Frequency ◽  
Image Sensors ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Shallow Trench Isolation ◽  
Noise Characteristics ◽  
Cmos Image Sensors ◽  
Trench Isolation ◽  
Source Follower

Investigation of Low-Frequency Noise Characteristics in Gated Schottky Diodes

2021 ◽  
Vol 42 (3) ◽  
pp. 442-445
Author(s):  
Dongseok Kwon ◽  
Wonjun Shin ◽  
Jong-Ho Bae ◽  
Suhwan Lim ◽  
Byung-Gook Park ◽  
...  
Keyword(s):  
Schottky Diodes ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Characteristics

Low-Frequency Noise Characteristics in Strained-Si nMOSFETs

2007 ◽  
Vol 28 (1) ◽  
pp. 36-38 ◽  
Author(s):  
Yen Ping Wang ◽  
San Lein Wu ◽  
Shoou Jinn Chang
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Strained Si ◽  
Noise Characteristics

Reliability investigation of light-emitting diodes via low frequency noise characteristics

2015 ◽  
Vol 55 (1) ◽  
pp. 52-61 ◽  
Author(s):  
Sandra Pralgauskaitė ◽  
Vilius Palenskis ◽  
Jonas Matukas ◽  
Justinas Glemža ◽  
Grigorij Muliuk ◽  
...  
Keyword(s):  
Light Emitting Diodes ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Light Emitting ◽  
Noise Characteristics
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