Effect of Annealing Temperature on Surface Morphology of Lanthanum Phosphate (LaPO4) Nanostructures Thin Films

2012 ◽  
Vol 626 ◽  
pp. 302-305 ◽  
Author(s):  
A.Z. Zainurul ◽  
M. Rusop ◽  
Saifollah Abdullah
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Annealing Temperature ◽  
Sol Gel ◽  
Coating Process ◽  
Force Microscopy ◽  
Lanthanum Phosphate ◽  
Atomic Force ◽  
Eds Analysis

LaPO4 particles with different morphologies and sizes have been successfully synthesized via sol-gel spinned coating process. The aim of this paper is to investigate the effect of annealing on the morphology and formation of LaPO4 on thin films. Physical structural properties of LaPO4 was investigated using atomic force microscopy (AFM-XE100). EDS analysis was done to check on the formation of LaPO4.

Dielectric Properties of Sol-Gel Derived MgAl2O4 Thin Films

2012 ◽  
Vol 151 ◽  
pp. 314-318
Author(s):  
Ching Fang Tseng ◽  
Cheng Hsing Hsu ◽  
Chun Hung Lai
Keyword(s):  
Thin Films ◽  
Annealing Temperature ◽  
Sol Gel ◽  
Dissipation Factor ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Preheating Temperature ◽  
Surface Morphologies

This paper describes microstructure characteristics of MgAl2O4 thin films were deposited by sol-gel method with various preheating temperatures and annealing temperatures. Particular attention will be paid to the effects of a thermal treatment in air ambient on the physical properties. The annealed films were characterized using X-ray diffraction. The surface morphologies of treatment film were examined by scanning electron microscopy and atomic force microscopy. At a preheating temperature of 300oC and an annealing temperature of 700oC, the MgAl2O4 films with 9 μm thickness possess a dielectric constant of 9 at 1 kHz and a dissipation factor of 0.18 at 1 kHz.

Nanoindention studies of DC sputtered Cu and Cu/Cr thin films

2001 ◽  
Vol 672 ◽  
Author(s):  
G. Wei ◽  
J. Du ◽  
A. Rar ◽  
J. A. Barnard
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Grain Size ◽  
Surface Morphology ◽  
Film Structure ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Grain Size And Orientation

ABSTRACTThe nanoindentation behavior of DC magnetron sputtered 10 nm Cu and 10 nm Cu/2 nm Cr thin films deposited on Si (100) has been studied using a Hysitron nanomechanical system. X- ray diffraction and X-ray reflectivity were used to measure the film structure and film thickness, respectively. The grain size and orientation of Cu and Cu/Cr thin films were measured by TEM. Atomic force microscopy (AFM) was used to evaluate the surface morphology and roughness. At the same load, the nanoindentaion displacement of Cu/Cr is smaller than that for Cu, i.e., the 2nm thick Cr underlayer enhances the hardness of Cu. X-ray, TEM, and AFM results show that the grain size of Cu/Cr (< 15 nm) is actually larger than Cu (∼ 3 nm) indicating that the inverse Hall-Petch relationship may be operative.

Surface Morphological Study of Lead Titanate Thin Films Prepared on ITO Glass Substrate

2015 ◽  
Vol 1109 ◽  
pp. 466-470 ◽  
Author(s):  
Nurbaya Zainal ◽  
Mohamad Rusop
Keyword(s):  
Thin Films ◽  
Surface Morphology ◽  
Glass Substrate ◽  
Lead Titanate ◽  
Sol Gel ◽  
Electrical Characterization ◽  
Force Microscopy ◽  
Atomic Force ◽  
Ito Glass ◽  
Coating Method

The most important thing in preparing thin films ceramic material such lead titanate, PbTiO3 is the behavioral of microstructural changes due to the applying heat treatment during crystallization process. In general, the imperfection of PbTiO3 surface morphology such as porosity, grain boundaries, existence of microcrack films, films out-diffusion and others are caused by this factor, heat transfer element and found very interesting to be discussed towards next electrical characterization. However, the present study only focuses on the surface morphology of PbTiO3 thin films that observed by both field emissions scanning electron microscopy (FESEM) and atomic force microscopy (AFM). The details of measurement for observation will be explained later. The preparation of PbTiO3 thin films were done trough simple sol-gel spin coating method deposited on ITO coated glass substrate.

Phase separation in SiO2–TiO2 gel and glassy films studied by atomic force microscopy and transmission electron microscopy

2001 ◽  
Vol 16 (6) ◽  
pp. 1626-1631 ◽  
Author(s):  
A. Karthikeyan ◽  
Rui M. Almeida
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Phase Separation ◽  
Sol Gel ◽  
Force Microscopy ◽  
Pure Silica ◽  
Atomic Force ◽  
Transmission Electron

An investigation of phase separation phenomena in gel and glassy thin films of silica–titania, with TiO2 contents of 20 and 40 mol%, has been carried out by atomic force microscopy (AFM) and transmission electron microscopy (TEM). The thin films were prepared by spin coating of a precursor sol on silicon wafers. Both the TEM measurements (carried out on scrapped thin film flakes) and the AFM measurements (carried out on films coated on the silicon substrates) for samples with different heat treatments suggest that spinodal-like structural inhomogeneities occur in these samples, unlike the corresponding observations in pure silica films, which are known to be homogeneous. Changes in the microstructure of the films have been noticed with the thermal treatment, in agreement with earlier x-ray photoemission studies. The finer characteristic dimensions of the phase separated regions reveal that silica–titania samples prepared by sol-gel processing exhibit a more intimate mixing of the phases.

Investigation of surface morphology of BaTiO3 thin films by atomic force microscopy

1995 ◽  
Vol 152 (2) ◽  
pp. K11-K14 ◽  
Author(s):  
Kun Ma ◽  
Jie Zhang ◽  
Junzheng Liu ◽  
Dafu Cui ◽  
Zhenghao Chen ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Force Microscopy ◽  
Atomic Force
Sign in / Sign up

Export Citation Format

Share Document