Spectrometric estimation of sample amount in aliquot for a direct solid sampling system and its application to the determination of trace impurities in silver nanoparticles by ETV-ICP-OES
Keyword(s):
Icp Oes
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2007 ◽
Vol 62
(3)
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pp. 304-308
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2011 ◽
Vol 66
(8)
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pp. 637-643
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2011 ◽
Vol 66
(5)
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pp. 378-382
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2012 ◽
Vol 71-72
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pp. 80-85
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2007 ◽
Vol 62
(3)
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pp. 297-303
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