An Analytical Model for the Transfer Characteristics of a Polycrystalline Silicon Thin-Film Transistor With a Double Exponential Grain-Boundary Trap-State Energy Dispersion

2009 ◽  
Vol 30 (10) ◽  
pp. 1072-1074 ◽  
Author(s):  
T. Chow ◽  
Man Wong
Keyword(s):  
Thin Film ◽  
Grain Boundary ◽  
Analytical Model ◽  
Polycrystalline Silicon ◽  
State Energy ◽  
Thin Film Transistor ◽  
Trap State ◽  
Silicon Thin Film ◽  
Energy Dispersion ◽  
Double Exponential

Dependence of polycrystalline silicon thin-film transistor characteristics on the grain-boundary location

2001 ◽  
Vol 89 (1) ◽  
pp. 596-600 ◽  
Author(s):  
Mutsumi Kimura ◽  
Satoshi Inoue ◽  
Tatsuya Shimoda ◽  
Tsukasa Eguchi
Keyword(s):  
Thin Film ◽  
Grain Boundary ◽  
Polycrystalline Silicon ◽  
Thin Film Transistor ◽  
Silicon Thin Film ◽  
Boundary Location

A Center-Offset Polycrystalline-Silicon Thin-Film Transistor With ${\rm n}^{+}$ Amorphous-Silicon Contacts

2009 ◽  
Vol 30 (1) ◽  
pp. 36-38 ◽  
Author(s):  
J. H. Oh ◽  
D. H. Kang ◽  
W. H. Park ◽  
J. Jang ◽  
Y. J. Chang ◽  
...  
Keyword(s):  
Thin Film ◽  
Amorphous Silicon ◽  
Polycrystalline Silicon ◽  
Thin Film Transistor ◽  
Silicon Thin Film
Sign in / Sign up

Export Citation Format

Share Document