Cross-sectional potential profile across a BaSi2pn junction by Kelvin probe force microscopy

2015 ◽  
Vol 54 (3) ◽  
pp. 030306 ◽  
Author(s):  
Daichi Tsukahara ◽  
Masakazu Baba ◽  
Kentaro Watanabe ◽  
Takashi Kimura ◽  
Kosuke O. Hara ◽  
...  
Keyword(s):  
Kelvin Probe Force Microscopy ◽  
Potential Profile ◽  
Kelvin Probe ◽  
Cross Sectional ◽  
Force Microscopy

Measurement of Cross-Sectional Potential of InAlAs/InGaAs Layered Structures in Vacuum by Kelvin Probe Force Microscopy

2003 ◽  
Vol 42 (Part 1, No. 4A) ◽  
pp. 1751-1752 ◽  
Author(s):  
Tengfeng Xie ◽  
Kei-ichiro Kumada ◽  
Shigeru Kishimoto ◽  
Takashi Mizutani
Keyword(s):  
Layered Structures ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Cross Sectional ◽  
Force Microscopy

Characterization of quantum wells by cross-sectional Kelvin probe force microscopy

2004 ◽  
Vol 85 (22) ◽  
pp. 5245-5247 ◽  
Author(s):  
O. Douhéret ◽  
S. Anand ◽  
Th. Glatzel ◽  
K. Maknys ◽  
S. Sadewasser
Keyword(s):  
Quantum Wells ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Cross Sectional ◽  
Force Microscopy

Potential profile evaluation of a diamond lateral p-n junction diode using Kelvin probe force microscopy

2015 ◽  
Vol 212 (11) ◽  
pp. 2589-2594
Author(s):  
Kazuya Shirota ◽  
Daisuke Takeuchi ◽  
Hiromitsu Kato ◽  
Toshiharu Makino ◽  
Masahiko Ogura ◽  
...  
Keyword(s):  
Kelvin Probe Force Microscopy ◽  
Potential Profile ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Junction Diode

Cross-Sectional Potential Imaging of Compound Semiconductor Heterostructure by Kelvin Probe Force Microscopy

1998 ◽  
Vol 37 (Part 1, No. 3B) ◽  
pp. 1522-1526 ◽  
Author(s):  
Takao Usunami ◽  
Masashi Arakawa ◽  
Shigeru Kishimoto ◽  
Takashi Mizutani ◽  
Toshiaki Kagawa ◽  
...  
Keyword(s):  
Compound Semiconductor ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Cross Sectional ◽  
Force Microscopy ◽  
Semiconductor Heterostructure
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