Infrared-spectroscopic porosimetry: Development and application for characterization of hundred-nanometer-thick porous thin films

2019 ◽  
Vol 685 ◽  
pp. 299-305
Author(s):  
Hiroki Nagasawa ◽  
Kosuke Eguchi ◽  
Masakoto Kanezashi ◽  
Toshinori Tsuru
Keyword(s):  
Thin Films ◽  
Porous Thin Films ◽  
Infrared Spectroscopic

Development and characterization of fluorine tin oxide electrodes modified with high area porous thin films containing gold nanoparticles

2010 ◽  
Vol 519 (1) ◽  
pp. 487-493 ◽  
Author(s):  
Carmen Quintana ◽  
Pedro Atienzar ◽  
Gerolamo Budroni ◽  
Laura Mora ◽  
Lucas Hernández ◽  
...  
Keyword(s):  
Thin Films ◽  
Gold Nanoparticles ◽  
Tin Oxide ◽  
Porous Thin Films ◽  
Oxide Electrodes ◽  
High Area

Characterization of Porous Thin Films Using Quartz Crystal Shear Resonators

Langmuir ◽  
2000 ◽  
Vol 16 (11) ◽  
pp. 5064-5071 ◽  
Author(s):  
R. Etchenique ◽  
V. L. Brudny
Keyword(s):  
Thin Films ◽  
Quartz Crystal ◽  
Porous Thin Films

Complementary neutron and X-ray reflectivity for structural characterization of porous thin films

2006 ◽  
Vol 385-386 ◽  
pp. 667-669 ◽  
Author(s):  
Yu-Shan Huang ◽  
U-Ser Jeng ◽  
Chia-Hung Hsu ◽  
Naoya Torikai ◽  
Hsin-Yi Lee ◽  
...  
Keyword(s):  
Thin Films ◽  
Structural Characterization ◽  
X Ray ◽  
Porous Thin Films

Characterization of optical devices based on liquid crystals embedded in porous thin films

2000 ◽  
Author(s):  
Jeremy C. Sit ◽  
Scott R. Kennedy ◽  
Dick J. Broer ◽  
Michael J. Brett
Keyword(s):  
Thin Films ◽  
Liquid Crystals ◽  
Optical Devices ◽  
Porous Thin Films

Structure and property characterization of low-k dielectric porous thin films

2001 ◽  
Vol 30 (4) ◽  
pp. 304-308 ◽  
Author(s):  
Barry J. Bauer ◽  
Eric K. Lin ◽  
Hae-Jeong Lee ◽  
Howard Wang ◽  
Wen-Li Wu
Keyword(s):  
Thin Films ◽  
Structure And Property ◽  
Porous Thin Films ◽  
Property Characterization ◽  
Low K
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