Complementary neutron and X-ray reflectivity for structural characterization of porous thin films

2006 ◽  
Vol 385-386 ◽  
pp. 667-669 ◽  
Author(s):  
Yu-Shan Huang ◽  
U-Ser Jeng ◽  
Chia-Hung Hsu ◽  
Naoya Torikai ◽  
Hsin-Yi Lee ◽  
...  
Keyword(s):  
Thin Films ◽  
Structural Characterization ◽  
X Ray ◽  
Porous Thin Films

In situ structural characterization of picene thin films by X-ray scattering: Vacuum versus O2 atmosphere

2012 ◽  
Vol 544 ◽  
pp. 34-38 ◽  
Author(s):  
T. Hosokai ◽  
A. Hinderhofer ◽  
A. Vorobiev ◽  
C. Lorch ◽  
T. Watanabe ◽  
...  
Keyword(s):  
Thin Films ◽  
Structural Characterization ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Structural Characterization of RF‐Sputtered a‐C:N Thin Films by Raman, IR, and X‐ray Reflectometry Spectroscopies

2008 ◽  
Vol 41 (3) ◽  
pp. 136-143
Author(s):  
A. Essafti ◽  
E. Ech‐chamikh ◽  
Y. Ijdiyaou ◽  
M. Azizan
Keyword(s):  
Thin Films ◽  
Structural Characterization ◽  
X Ray

Growth and structural characterization of Cu2ZnSnSe4 compound for solar cells

2014 ◽  
Vol 92 (7/8) ◽  
pp. 902-904 ◽  
Author(s):  
N. Seña ◽  
F. Mesa ◽  
A. Dussan ◽  
G. Gordillo
Keyword(s):  
Thin Films ◽  
Structural Characterization ◽  
Deposition Temperature ◽  
Mass Ratio ◽  
Electrical Behavior ◽  
X Ray Diffraction ◽  
X Ray ◽  
Deposition Parameters ◽  
Stage Process

This work reports results concerning the effect of the deposition parameters on the structural properties of Cu2ZnSnSe4 thin films, grown through a chemical reaction of the metallic precursors via coevaporation in a three-stage process. X-ray diffraction measurements revealed that the samples deposited by selenization of Cu and Sn grow in the Cu2Se and SnSe2 phases, respectively. The effect of deposition temperature and Cu/Se mass ratio on the transport properties of Cu2ZnSnSe4 films was analyzed. The electrical behavior of the compound was studied.

Structural characterization of the temperature dependence of C60‐thin films on mica (001) by x‐ray diffraction

1994 ◽  
Vol 76 (6) ◽  
pp. 3337-3340 ◽  
Author(s):  
S. Henke ◽  
K. H. Thürer ◽  
J. K. N. Lindner ◽  
B. Rauschenbach ◽  
B. Stritzker
Keyword(s):  
Thin Films ◽  
Temperature Dependence ◽  
Structural Characterization ◽  
X Ray Diffraction ◽  
X Ray
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