Atomic scale characterization of point and extended defects in niobate thin films

2019 ◽  
Vol 203 ◽  
pp. 82-87 ◽  
Author(s):  
Changjian Li ◽  
Dongsheng Song ◽  
Mengsha Li ◽  
Chunhua Tang ◽  
Deqing Xue ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Scale ◽  
Extended Defects ◽  
Scale Characterization

scholarly journals Atomic Scale Characterization of LSFMO Thin Films Using Aberration Corrected STEM

2010 ◽  
Vol 16 (S2) ◽  
pp. 146-147
Author(s):  
M Gu ◽  
Y Takamura ◽  
ND Browning
Keyword(s):  
Thin Films ◽  
Atomic Scale ◽  
Aberration Corrected Stem ◽  
Scale Characterization ◽  
Aberration Corrected

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Atomic scale characterization of HfO2∕Al2O3 thin films grown on nitrided and oxidized Si substrates

2004 ◽  
Vol 96 (11) ◽  
pp. 6113-6119 ◽  
Author(s):  
T. Nishimura ◽  
T. Okazawa ◽  
Y. Hoshino ◽  
Y. Kido ◽  
K. Iwamoto ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Scale ◽  
Si Substrates ◽  
Scale Characterization

Atomic-Scale Characterization of Oxide Thin Films Gated by Ionic Liquid

2014 ◽  
Vol 6 (19) ◽  
pp. 17018-17023 ◽  
Author(s):  
Andrew C. Lang ◽  
Jennifer D. Sloppy ◽  
Hessam Ghassemi ◽  
Robert C. Devlin ◽  
Rebecca J. Sichel-Tissot ◽  
...  
Keyword(s):  
Thin Films ◽  
Ionic Liquid ◽  
Atomic Scale ◽  
Oxide Thin Films ◽  
Scale Characterization

Atomic scale characterization of GaInN/GaN multiple quantum wells in V-shaped pits

2011 ◽  
Vol 98 (18) ◽  
pp. 181904 ◽  
Author(s):  
Shigetaka Tomiya ◽  
Yuya Kanitani ◽  
Shinji Tanaka ◽  
Tadakatsu Ohkubo ◽  
Kazuhiro Hono
Keyword(s):  
Quantum Wells ◽  
Atomic Scale ◽  
Multiple Quantum Wells ◽  
Multiple Quantum ◽  
Scale Characterization

scholarly journals Combined Macroscopic, Nanoscopic, and Atomic-Scale Characterization of Gold-Ruthenium Bimetallic Catalysts for Octanol Oxidation

2016 ◽  
Vol 33 (7) ◽  
pp. 419-437 ◽  
Author(s):  
Lidia E. Chinchilla ◽  
Carol Olmos ◽  
Mert Kurttepeli ◽  
Sara Bals ◽  
Gustaaf Van Tendeloo ◽  
...  
Keyword(s):  
Bimetallic Catalysts ◽  
Atomic Scale ◽  
Scale Characterization

Atomic Scale Characterization of the Pt/TiO2; Interface

2004 ◽  
Vol 10 (S02) ◽  
pp. 452-453
Author(s):  
Hakim Iddir ◽  
Mark Disko ◽  
Nigel D. Browning ◽  
Serdar Ogut
Keyword(s):  
Atomic Scale ◽  
Scale Characterization

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Atomic-scale characterization of the interfacial phonon in graphene/SiC

2017 ◽  
Vol 96 (15) ◽  
Author(s):  
Emi Minamitani ◽  
Ryuichi Arafune ◽  
Thomas Frederiksen ◽  
Tetsuya Suzuki ◽  
Syed Mohammad Fakruddin Shahed ◽  
...  
Keyword(s):  
Atomic Scale ◽  
Scale Characterization

Atomic-scale characterization of theSrTiO3Σ3(112)[1¯10]grain boundary

2010 ◽  
Vol 81 (13) ◽  
Author(s):  
K. J. Dudeck ◽  
N. A. Benedek ◽  
M. W. Finnis ◽  
D. J. H. Cockayne
Keyword(s):  
Grain Boundary ◽  
Atomic Scale ◽  
Scale Characterization
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