Atomic-Scale Characterization of Oxide Thin Films Gated by Ionic Liquid

2014 ◽  
Vol 6 (19) ◽  
pp. 17018-17023 ◽  
Author(s):  
Andrew C. Lang ◽  
Jennifer D. Sloppy ◽  
Hessam Ghassemi ◽  
Robert C. Devlin ◽  
Rebecca J. Sichel-Tissot ◽  
...  
Keyword(s):  
Thin Films ◽  
Ionic Liquid ◽  
Atomic Scale ◽  
Oxide Thin Films ◽  
Scale Characterization

Atomic scale characterization of point and extended defects in niobate thin films

2019 ◽  
Vol 203 ◽  
pp. 82-87 ◽  
Author(s):  
Changjian Li ◽  
Dongsheng Song ◽  
Mengsha Li ◽  
Chunhua Tang ◽  
Deqing Xue ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Scale ◽  
Extended Defects ◽  
Scale Characterization

scholarly journals Atomic Scale Characterization of LSFMO Thin Films Using Aberration Corrected STEM

2010 ◽  
Vol 16 (S2) ◽  
pp. 146-147
Author(s):  
M Gu ◽  
Y Takamura ◽  
ND Browning
Keyword(s):  
Thin Films ◽  
Atomic Scale ◽  
Aberration Corrected Stem ◽  
Scale Characterization ◽  
Aberration Corrected

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Atomic scale characterization of HfO2∕Al2O3 thin films grown on nitrided and oxidized Si substrates

2004 ◽  
Vol 96 (11) ◽  
pp. 6113-6119 ◽  
Author(s):  
T. Nishimura ◽  
T. Okazawa ◽  
Y. Hoshino ◽  
Y. Kido ◽  
K. Iwamoto ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Scale ◽  
Si Substrates ◽  
Scale Characterization

Atomic scale characterization of GaInN/GaN multiple quantum wells in V-shaped pits

2011 ◽  
Vol 98 (18) ◽  
pp. 181904 ◽  
Author(s):  
Shigetaka Tomiya ◽  
Yuya Kanitani ◽  
Shinji Tanaka ◽  
Tadakatsu Ohkubo ◽  
Kazuhiro Hono
Keyword(s):  
Quantum Wells ◽  
Atomic Scale ◽  
Multiple Quantum Wells ◽  
Multiple Quantum ◽  
Scale Characterization

Synthesis and characterization of tin (IV) oxide thin films

2021 ◽  
Vol 53 (5) ◽  
Author(s):  
M. Rahayi ◽  
M. H. Ehsani ◽  
Agnes C. Nkele ◽  
M. M. Shahidi ◽  
Fabian I. Ezema
Keyword(s):  
Thin Films ◽  
Synthesis And Characterization ◽  
Oxide Thin Films

Characterization of porous tin oxide thin films and their application to microsensor fabrication

1995 ◽  
Vol 25 (1-3) ◽  
pp. 482-485 ◽  
Author(s):  
Wan-Young Chung ◽  
Tae-Hoon Kim ◽  
Young-Ho Hong ◽  
Duk-Dong Lee
Keyword(s):  
Thin Films ◽  
Tin Oxide ◽  
Oxide Thin Films

scholarly journals Combined Macroscopic, Nanoscopic, and Atomic-Scale Characterization of Gold-Ruthenium Bimetallic Catalysts for Octanol Oxidation

2016 ◽  
Vol 33 (7) ◽  
pp. 419-437 ◽  
Author(s):  
Lidia E. Chinchilla ◽  
Carol Olmos ◽  
Mert Kurttepeli ◽  
Sara Bals ◽  
Gustaaf Van Tendeloo ◽  
...  
Keyword(s):  
Bimetallic Catalysts ◽  
Atomic Scale ◽  
Scale Characterization
Sign in / Sign up

Export Citation Format

Share Document