Fabrication and characterization of a miniaturized octupole deflection system for the MEMS electron microscope

Fabrication of ZnO nanowires (NWs) by thermal oxidation method has been studied in this work. The ZnO NWs have been grown by oxidation of Zn metal foil under oxygen environment for two typical oxidation durations. We have investigated the behavior of the as-grown ZnO NWs with the change in oxidation duration at particular temperature. The changes in surface morphology and chemical composition with the variation of oxidation duration have been analyzed by scanning electron microscope (SEM) and energy dispersive spectroscopy (EDS) respectively. From EDS spectra, it is confirmed that Zn metal has completely oxidized into ZnO for higher oxidation duration. In this work, the optimized duration of oxidation for growth of ZnO NWs is found to be ~60 minutes at particular temperature of 600oC. The present method provides a possible mechanism for the growth of ZnO NWs on the p-Si substrates.

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Fabrication and Characterization of Nano-Sized Starch Particles

Advanced Materials Research ◽

10.4028/www.scientific.net/amr.1120-1121.275 ◽

2015 ◽

Vol 1120-1121 ◽

pp. 275-280

Author(s):

Hua Lin ◽

Qing Li ◽

Mu Feng ◽

Li Zhao Qin

Keyword(s):

Fourier Transform ◽

Electron Microscope ◽

Experimental Conditions ◽

Transmission Electron ◽

Infrared Spectrometer ◽

Ft Ir ◽

Plausible Mechanism ◽

Fabrication And Characterization ◽

The Fourier Transform

An efficient method of preparing nanostarch using high-intensity ultrasonic irradiation and acid hydrolysis was discussed. The transmission electron microscope (TEM) showed that the nanosized starch particles were in shape of sphere with the size of 80-120 nm, and their surfaces were rough with many flocci. The Fourier transform infrared spectrometer (FT-IR) revealed that the products maintained the original biological characteristics, and the molecules did not undergo any chemical changes. In addition, the effects of experimental conditions were analyzed and a plausible mechanism was proposed to explain the formation of the nanostarch.

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Fabrication and characterization of ferrites (Mg and Mn) based on FTIR, XRD, SEM and TEM

Malaysian Journal of Fundamental and Applied Sciences ◽

10.11113/mjfas.v8n3.140 ◽

2014 ◽

Vol 8 (3) ◽

Author(s):

Tang Ing Hua ◽

Rita Sundari

Keyword(s):

Electron Microscope ◽

Volume Expansion ◽

Sol Gel ◽

X Ray Diffraction ◽

Semiconducting Materials ◽

Thermal Agitation ◽

X Ray ◽

Transmission Electron ◽

Fabrication And Characterization

This study has encountered with the fabrication of ferrites (Mg and Mn) using citric acid as anionic surfactant in sol-gel method followed by calcinations at varied temperatures (300, 600, 800°C) for 2h, respectively. The fabricated ferrites have been characterized by FTIR (Fourier Transform Infrared Spectroscopy), XRD (X-Ray Diffraction), SEM (Scanning Electron Microscope) and TEM (Transmission Electron Microscope). The FTIR spectrum for MnFeO3 shows that some functional groups already removed under 300°C calcination due to several oxidation numbers possessed by Mn leading to more flexibility. The XRD diffractograms for both MgFe2O4 and MnFeO3 show that the transition phase from amorphous to crystalline structure occurred in the temperature range of 300-600°C. The SEM mappings based on the Fe distribution for both MgFe2O4 and MnFeO3 show that more Fe distributed over the ferrites surface at 600 and 800°C, while the SEM mappings for both ferrites (Mg and Mn) show less Fe distribution at 300°C calcination, thus, it indicates more repulsion force bearing by higher amounts of Fe atoms at higher thermal agitation due to volume expansion. The TEM spectra proved that both ferrites existed as crystals after calcined at 600°C. The fabricated ferrites have remarkable electrical properties useful for the manufacture of semiconducting materials.

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Fabrication and Characterization of Carbon Nanofibers Carrying Ag Nanoparticles via Electrospinning

Solid State Phenomena ◽

10.4028/www.scientific.net/ssp.121-123.123 ◽

2007 ◽

Vol 121-123 ◽

pp. 123-126 ◽

Cited By ~ 2

Author(s):

Z.Y. Li ◽

Hui Min Huang ◽

C. Wang

Keyword(s):

Fourier Transform ◽

Electron Microscope ◽

Carbon Nanofibers ◽

Ag Nanoparticles ◽

X Ray Diffraction ◽

X Ray ◽

Transmission Electron ◽

Fabrication And Characterization ◽

Pan Fibers

The carbon-nanofibers carrying Ag nanoparticles (Ag/CNF) have been successfully obtained via electrospinning followed by calcination. For it, AgNO3/polyacrylonitrile (PAN) fibers were firstly prepared as an intermediate and then the intermediate was calcined at 600°C for 4h to transit the PAN nanofibers to the CNF and reduce AgNO3 to the Ag nanoparticles. Transmission electron microscope (TEM), Fourier transform infrared (FTIR) spectroscopy and X-ray diffraction (XRD) were used to characterize their morphologies and structures. The results show that the diameters of the Ag nanoparticles and CNF are 5 nm and 180 nm on the average, respectively. Most of the Ag nanoparticles were located on the surface of carbon nanofibers.

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Fabrication and Characterization of Cellulose Acetate Nanofibers

Advanced Materials Research ◽

10.4028/www.scientific.net/amr.1030-1032.78 ◽

2014 ◽

Vol 1030-1032 ◽

pp. 78-81

Author(s):

Zainal Anisah ◽

Naznin Sultana ◽

Mohammed Rafiq Abdul Kadir

Keyword(s):

Acetic Acid ◽

Electron Microscope ◽

Scanning Electron Microscope ◽

Morphological Structure ◽

Average Diameter ◽

Solvent System ◽

Electrospinning Technique ◽

Fabrication And Characterization ◽

Scanning Electron

In this study, CA fibers were fabricated using electrospinning technique with the mixture of acetic acid/acetone as the solvent system with the ratio of 3:1. The morphological structure of the fibers obtained was observed using scanning electron microscope (SEM). The SEM results showed that 10% of CA produced beads only, 12% of CA produced spindle beads with few fibers, 13% of CA produced fibers with few beads and 14% w/v concentration of CA produced continuous and smooth ribbon-like fibers with average diameter of 199.23nm.

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Characterization of Sputtered Films using the Scanning Electron Microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100070667 ◽

1973 ◽

Vol 31 ◽

pp. 44-45

Author(s):

R. F. Schneidmiller ◽

W. F. Thrower ◽

C. Ang

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Thin Film Deposition ◽

Film Deposition ◽

Sputtered Films ◽

Plasma Sputtering ◽

Microelectronic Devices ◽

Control Film ◽

Scanning Electron

Solid state materials in the form of thin films have found increasing structural and electronic applications. Among the multitude of thin film deposition techniques, the radio frequency induced plasma sputtering has gained considerable utilization in recent years through advances in equipment design and process improvement, as well as the discovery of the versatility of the process to control film properties. In our laboratory we have used the scanning electron microscope extensively in the direct and indirect characterization of sputtered films for correlation with their physical and electrical properties.Scanning electron microscopy is a powerful tool for the examination of surfaces of solids and for the failure analysis of structural components and microelectronic devices.

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An Electron Microscope Study of Interdiffusion and Compound Formation in Ta-Au Thin Films

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100070606 ◽

1973 ◽

Vol 31 ◽

pp. 32-33 ◽

Cited By ~ 1

Author(s):

T. C. Tisone ◽

S. Lau

Keyword(s):

Electron Microscope ◽

Electron Microscope Study ◽

Thermally Grown Oxide ◽

Ion Milling ◽

Compound Formation ◽

Technology Application ◽

Transmission Electron ◽

Before And After ◽

Au Thin Films

In a study of the properties of a Ta-Au metallization system for thin film technology application, the interdiffusion between Ta(bcc)-Au, βTa-Au and Ta2M-Au films was studied. Considered here is a discussion of the use of the transmission electron microscope(TEM) in the identification of phases formed and characterization of the film microstructures before and after annealing.The films were deposited by sputtering onto silicon wafers with 5000 Å of thermally grown oxide. The film thicknesses were 2000 Å of Ta and 2000 Å of Au. Samples for TEM observation were prepared by ultrasonically cutting 3mm disks from the wafers. The disks were first chemically etched from the silicon side using a HNO3 :HF(19:5) solution followed by ion milling to perforation of the Au side.

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