The influence of chromatic aberration on the dose-limited spatial resolution of transmission electron microscopy

2021 ◽  
Vol 230 ◽  
pp. 113383
Author(s):  
Eduardo Ortega ◽  
Chris Boothroyd ◽  
Niels de Jonge
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Spatial Resolution ◽  
Chromatic Aberration ◽  
Transmission Electron

The use of an energy-filtering electron microscope to reduce chromatic aberration in images of thick biological specimens

1986 ◽  
Vol 44 ◽  
pp. 88-91
Author(s):  
L. D. Peachey ◽  
J. P. Heath ◽  
G. Lamprecht
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Beam ◽  
Cross Section ◽  
Electron Scattering ◽  
Chromatic Aberration ◽  
Image Resolution ◽  
Incident Electron Energy ◽  
Energy Filtering ◽  
Transmission Electron

Biological specimens of cells and tissues generally are considerably thicker than ideal for high resolution transmission electron microscopy. Actual image resolution achieved is limited by chromatic aberration in the image forming electron lenses combined with significant energy loss in the electron beam due to inelastic scattering in the specimen. Increased accelerating voltages (HVEM, IVEM) have been used to reduce the adverse effects of chromatic aberration by decreasing the electron scattering cross-section of the elements in the specimen and by increasing the incident electron energy.

A method of precise misorientation determination

2003 ◽  
Vol 36 (6) ◽  
pp. 1319-1323 ◽  
Author(s):  
A. Morawiec
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Spatial Resolution ◽  
Standard Procedure ◽  
Good Spatial Resolution ◽  
Transmission Electron ◽  
Order Of Magnitude ◽  
Achievable Accuracy ◽  
Better Than

A method that improves the accuracy of misorientations determined from Kikuchi patterns is described. It is based on the fact that some parameters of a misorientation calculated from two orientations are more accurate than other parameters. A procedure which eliminates inaccurate elements is devised. It requires at least two foil inclinations. The quality of the approach relies on the possibility to set large sample-to-detector distances and the availability of good spatial resolution of transmission electron microscopy. Achievable accuracy is one order of magnitude better than the accuracy of the standard procedure.

Chemical Nano-tomography of Self-assembled Ge-Si:Si(001) Islands from Quantitative High Resolution Transmission Electron Microscopy

2009 ◽  
Vol 1184 ◽  
Author(s):  
Luciano Andrey Montoro ◽  
Marina Leite ◽  
Daniel Biggemann ◽  
Fellipe Grillo Peternella ◽  
Kees Joost Batenburg ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Three Dimensional ◽  
Precise Knowledge ◽  
Transmission Electron ◽  
Self Consistent ◽  
Chemical Distribution

AbstractThe knowledge of composition and strain with high spatial resolution is highly important for the understanding of the chemical and electronic properties of alloyed nanostructures. Several applications require a precise knowledge of both composition and strain, which can only be extracted by self-consistent methodologies. Here, we demonstrate the use of a quantitative high resolution transmission electron microscopy (QHRTEM) technique to obtain two-dimensional (2D) projected chemical maps of epitaxially grown Ge-Si:Si(001) islands, with high spatial resolution, at different crystallographic orientations. By a combination of these data with an iterative simulation, it was possible infer the three-dimensional (3D) chemical arrangement on the strained Ge-Si:Si(001) islands, showing a four-fold chemical distribution which follows the nanocrystal shape/symmetry. This methodology can be applied for a large variety of strained crystalline systems, such as nanowires, epitaxial islands, quantum dots and wells, and partially relaxed heterostructures.

Techniques for Investigating Structure and Composition with High Spatial Resolution

1981 ◽  
Vol 8 ◽  
Author(s):  
John B. Vander Sande
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Spatial Resolution ◽  
Scanning Transmission Electron Microscopy ◽  
High Spatial Resolution ◽  
Compositional Analysis ◽  
Atom Probe ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission

ABSTRACTThe techniques of scanning transmission electron microscopy and field iron microscopy/atom probe are briefly described. The advantages of these techniques for high spatial resolution compositional analysis are discussed and examples cited.

scholarly journals Opportunities for Chromatic Aberration Corrected High-Resolution Transmission Electron Microscopy, Lorentz Microscopy and Electron Holography of Magnetic Minerals

2012 ◽  
Vol 18 (S2) ◽  
pp. 1708-1709 ◽  
Author(s):  
R. Dunin-Borkowski ◽  
L. Houben ◽  
J. Barthel ◽  
A. Thust ◽  
M. Luysberg ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Chromatic Aberration ◽  
Electron Holography ◽  
Magnetic Minerals ◽  
Lorentz Microscopy ◽  
Transmission Electron ◽  
Aberration Corrected

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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