Analytical transmission electron microscopy with high spatial resolution ? possibilities and limitations

1990 ◽  
Vol 337 (5) ◽  
pp. 469-481 ◽  
Author(s):  
E. Bischoff ◽  
G. H. Campbell ◽  
M. R�hle
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Analytical Transmission Electron Microscopy ◽  
Transmission Electron

Chemical Nano-tomography of Self-assembled Ge-Si:Si(001) Islands from Quantitative High Resolution Transmission Electron Microscopy

2009 ◽  
Vol 1184 ◽  
Author(s):  
Luciano Andrey Montoro ◽  
Marina Leite ◽  
Daniel Biggemann ◽  
Fellipe Grillo Peternella ◽  
Kees Joost Batenburg ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Three Dimensional ◽  
Precise Knowledge ◽  
Transmission Electron ◽  
Self Consistent ◽  
Chemical Distribution

AbstractThe knowledge of composition and strain with high spatial resolution is highly important for the understanding of the chemical and electronic properties of alloyed nanostructures. Several applications require a precise knowledge of both composition and strain, which can only be extracted by self-consistent methodologies. Here, we demonstrate the use of a quantitative high resolution transmission electron microscopy (QHRTEM) technique to obtain two-dimensional (2D) projected chemical maps of epitaxially grown Ge-Si:Si(001) islands, with high spatial resolution, at different crystallographic orientations. By a combination of these data with an iterative simulation, it was possible infer the three-dimensional (3D) chemical arrangement on the strained Ge-Si:Si(001) islands, showing a four-fold chemical distribution which follows the nanocrystal shape/symmetry. This methodology can be applied for a large variety of strained crystalline systems, such as nanowires, epitaxial islands, quantum dots and wells, and partially relaxed heterostructures.

Techniques for Investigating Structure and Composition with High Spatial Resolution

1981 ◽  
Vol 8 ◽  
Author(s):  
John B. Vander Sande
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Spatial Resolution ◽  
Scanning Transmission Electron Microscopy ◽  
High Spatial Resolution ◽  
Compositional Analysis ◽  
Atom Probe ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission

ABSTRACTThe techniques of scanning transmission electron microscopy and field iron microscopy/atom probe are briefly described. The advantages of these techniques for high spatial resolution compositional analysis are discussed and examples cited.

scholarly journals Characterization of Cement Alteration Process by Transmission Electron Microscopy with High Spatial Resolution

2006 ◽  
Vol 43 (11) ◽  
pp. 1370-1378 ◽  
Author(s):  
Shinya MIYAMOTO ◽  
Seiichiro UEHARA ◽  
Michitaka SASOH ◽  
Mitsuyoshi SATO ◽  
Masumitsu TOYOHARA ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Alteration Process ◽  
Transmission Electron

High Spatial Resolution Surface Analysis of Zeolite Catalysts in the Low-Voltage FE-SEM

2000 ◽  
Vol 6 (S2) ◽  
pp. 30-31
Author(s):  
Jingyue Liu
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Low Voltage ◽  
Incident Beam ◽  
Zeolite Catalysts ◽  
Stringent Requirement ◽  
Transmission Electron ◽  
Electron Microscopes

High spatial resolution chemical microanalysis of heterogeneous catalysts is traditionally done in transmission electron microscopy or scanning transmission electron microscopy (TEM/STEM) instruments. A major limitation of TEM/STEM techniques is, however, the stringent requirement of samples that can be examined: useful information can be extracted from only very thin areas of a sample. The preparation of suitable TEM samples may also pose a major problem for observing certain types of commercial catalysts, for example, beads, powders, or cylinders that are frequently used in catalytic reactions. These limitations preclude the application of TEM/STEM techniques to extracting information about the surface properties of thick or bulk catalyst samples.With the recent development of high-resolution, field-emission scanning electron microscopes (FESEM), bulk samples can now be examined at a nanometer or sub-nanometer spatial resolution. At low incident beam energies, not only the emitted SE signal is more surface-sensitive but also charging of non-conducting materials is significantly reduced.

Studies of Corrosion of Al Thin Films using Liquid Cell Transmission Electron Microscopy

2013 ◽  
Vol 1525 ◽  
Author(s):  
See Wee Chee ◽  
Frances M. Ross ◽  
David Duquette ◽  
Robert Hull
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Pure Water ◽  
Transmission Electron ◽  
Liquid Cell ◽  
Grain Size And Orientation

ABSTRACTA fundamental understanding of the processes that occur during early stages of corrosion is traditionally limited by the dearth of techniques that probe the liquid-solid interface with both high spatial resolution and microstructural detail such as grain size and orientation. Here, we demonstrate that with a microfluidic liquid flow cell holder, we can track the progress of corrosion in situ in Al thin films with transmission electron microscopy (TEM). To mitigate the loss of resolution caused by imaging through liquid, we developed a method in which the liquid is temporarily de-wetted from the entire windowed area by switching the liquid stream from pure water to a mixture of ethanol and water. In the de-wetted region, we then collected images of the film microstructure with high spatial resolution over regular intervals while maintaining a low electron flux over the imaged area to minimize beam-induced effects. For as-deposited films, we find that the corrosion progresses in a fractal manner, consistent with reported behavior for films studied in water with low iron and chloride concentrations. For films that were subjected to rapid thermal annealing, we observe a higher density of pitting events, which we attribute to defects created by thermal stress in the oxide film. Furthermore, we observe that the pits can form at multiple locations in a single grain and are not confined to grain boundaries.

Characterization of submicrometer fluid Inclusions in minerals by Analytical/Transmission Electron Microscopy and electron diffraction

1990 ◽  
Vol 48 (4) ◽  
pp. 424-424
Author(s):  
George Guthrie ◽  
David Veblen
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Electron Diffraction ◽  
Light Microscopy ◽  
Fluid Inclusions ◽  
Energy Dispersive Spectrometer ◽  
Analytical Transmission Electron Microscopy ◽  
Transmission Electron

The nature of a geologic fluid can often be inferred from fluid-filled cavities (generally <100 μm in size) that are trapped during the growth of a mineral. A variety of techniques enables the fluids and daughter crystals (any solid precipitated from the trapped fluid) to be identified from cavities greater than a few micrometers. Many minerals, however, contain fluid inclusions smaller than a micrometer. Though inclusions this small are difficult or impossible to study by conventional techniques, they are ideally suited for study by analytical/ transmission electron microscopy (A/TEM) and electron diffraction. We have used this technique to study fluid inclusions and daughter crystals in diamond and feldspar.Inclusion-rich samples of diamond and feldspar were ion-thinned to electron transparency and examined with a Philips 420T electron microscope (120 keV) equipped with an EDAX beryllium-windowed energy dispersive spectrometer. Thin edges of the sample were perforated in areas that appeared in light microscopy to be populated densely with inclusions. In a few cases, the perforations were bound polygonal sides to which crystals (structurally and compositionally different from the host mineral) were attached (Figure 1).

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