Fourier transform infra-red characterization of carbon onions produced by carbon-ion implantation

1998 ◽  
Vol 285 (3-4) ◽  
pp. 216-220 ◽  
Author(s):  
T. Cabioc'h ◽  
A. Kharbach ◽  
A. Le Roy ◽  
J.P. Rivière
2000 ◽  
Vol 128-129 ◽  
pp. 43-50 ◽  
Author(s):  
T Cabioc’h ◽  
M Jaouen ◽  
E Thune ◽  
P Guérin ◽  
C Fayoux ◽  
...  

Polymer ◽  
1991 ◽  
Vol 32 (6) ◽  
pp. 1010-1016 ◽  
Author(s):  
Mitsuhiro Shibayama ◽  
Tomoyuki Yamamoto ◽  
Chang-Fa Xiao ◽  
Shinichi Sakurai ◽  
Akira Hayami ◽  
...  

1998 ◽  
Author(s):  
Alejandro Perez-Rodriguez ◽  
A. Romano-Rodriguez ◽  
Christoph Serre ◽  
L. Calvo-Barrio ◽  
O. Gonzalez-Varona ◽  
...  

2021 ◽  
Vol 9 (2) ◽  
pp. 81-87
Author(s):  
Dwi Rasy Mujiyanti ◽  
Dahlena Ariyani ◽  
Muna Lisa

Research on analysis of rice husk content of Siam Unus with various NaOH concentrations (1.0 M; 1.5 M; 2.0 M; 2.5 M; 3.0 M) has been done. This study aims to obtain data on the effect of variations in NaOH concentration on the purity of the silica extract from Siam Unus rice husks and silica characterization of Siam Unus rice husks using Fourier Transform Infra-Red (FTIR) and X-ray fluorescence spectrometry (XRF). The results showed that the combustion of rice husks at 200 °C as optimum temperature for 1 hour followed by combustion at 600 °C for 4 hours produces grayish-white rice husks with a yield is 20.70%. Silica functional group characterization showed that silanol (Si-OH) and siloxane (Si-O-Si) as dominant functional groups. The result of composition characterization using XRF showed that SiO2 as the dominant compound with the highest percentage of SiO2 is 1.5 M NaOH extract at 42.80%.


2017 ◽  
Vol 3 (1) ◽  
pp. 215 ◽  
Author(s):  
Wirda Udaibah ◽  
Agus Priyanto

<p style="text-align: justify;">The Research about Synthesis and Characterization of SiO2 have been worked. We have synthesized Silica from “petung”bamboo leaf ash as SiO2 source. This step used sol gel methode. SiO2 were characterized by Fourier Transform Infra Red (FTIR) to investigated the stucture andX-Ray Diffaction to know about structure and crystallinity. FTIR spectra show peak at 617,22 cm-1 area that spesific for Si-H bond, peak at 786,96 cm-1and 1095,57 cm-1 area specific for Si-O-Si bonds. Difractogram of SiO2 show that there are peak at 2θ 21,99; 31,67 and 38,88 were specific for SiO2 that calcinated at 800oC, while for SiO2 that calcinated at 400oC there were no peak at 2θ 31,67 dan 38,88. That peaks not shown may be because low crystallinity of SiO2 that calcinated at 400oC. Calcination temperature greatly affects the crystallinity of SiO2.©2017 JNSMR UIN Walisongo. All rights reserved.</p>


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