Time response of the thin layer electrochemical cell used for in situ X-ray diffraction

ABSTRACTWe present results of a study motivated by the recent suggestion that the properties of nanocrystalline materials with a large surface-to-volume ratio can be tuned by inducing spacecharge regions at interfaces by means of an applied voltage. As an example, we investigate the reversible variation of the lattice constant of platinum nanoparticles immersed in an aqueous 1M KOH electrolyte as a function of applied potential. It is found that a reversible volumetric strain of up to 1.2 % can be induced, corresponding to pressures of up to 3.2 GPa. We present the experimental set-ups for in-situ X-ray diffraction with an electrochemical cell. The variation of the space charge at the metal-electrolyte interface results in a variation of the surface stress f as a function of the applied potential, which is not an electrocapillary effect.

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In situ X-ray diffraction experiments on lithium intercalation compounds

Canadian Journal of Physics ◽

10.1139/p82-040 ◽

1982 ◽

Vol 60 (3) ◽

pp. 307-313 ◽

Cited By ~ 72

Author(s):

J. R. Dahn ◽

M. A. Py ◽

R. R. Haering

Keyword(s):

Electrochemical Cell ◽

Lithium Concentration ◽

Host Lattice ◽

Intercalation Compounds ◽

Lithium Intercalation ◽

X Ray Diffraction ◽

Detailed Design ◽

X Ray

We describe powder X-ray diffraction experiments on lithium intercalation compounds. Using a unique electrochemical cell which incorporates a beryllium X-ray window we are able to monitor changes in the host lattice which occur when the lithium concentration is altered electrochemically. The detailed design of the cells and experimental problems which arise when using the in situ X-ray diffraction technique are discussed. Results of experiments on LixTiS2 are reported for 0 ≤ x ≤ 2.

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A transmission geometry electrochemical cell for in situ x‐ray diffraction

Review of Scientific Instruments ◽

10.1063/1.1144178 ◽

1993 ◽

Vol 64 (4) ◽

pp. 1061-1065 ◽

Cited By ~ 23

Author(s):

K. M. Robinson ◽

W. E. O’Grady

Keyword(s):

Electrochemical Cell ◽

X Ray Diffraction ◽

X Ray ◽

Transmission Geometry

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An Electrochemical Cell for Simultaneous In Situ X‐Ray Diffraction and Optical Measurements

Journal of The Electrochemical Society ◽

10.1149/1.1838710 ◽

1998 ◽

Vol 145 (8) ◽

pp. 2759-2762 ◽

Cited By ~ 6

Author(s):

E. A. Meulenkamp

Keyword(s):

Electrochemical Cell ◽

Optical Measurements ◽

X Ray Diffraction ◽

X Ray

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Time response demonstration of in situ lattice deformation under an applied electric field by synchrotron-based time-resolved X-ray diffraction in polar-axis-oriented epitaxial Pb(Zr,Ti)O3 film

Japanese Journal of Applied Physics ◽

10.7567/jjap.57.0902b8 ◽

2018 ◽

Vol 57 (9) ◽

pp. 0902B8 ◽

Cited By ~ 1

Author(s):

Tomoya Sato ◽

Daichi Ichinose ◽

Naoya Oshima ◽

Takanori Mimura ◽

Yuichi Nemoto ◽

...

Keyword(s):

Electric Field ◽

Applied Electric Field ◽

Polar Axis ◽

Time Response ◽

Lattice Deformation ◽

X Ray Diffraction ◽

Time Resolved ◽

X Ray

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The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100071107 ◽

1973 ◽

Vol 31 ◽

pp. 132-133 ◽

Cited By ~ 1

Author(s):

R. E. Herfert

Keyword(s):

Surface Characterization ◽

Analytical Techniques ◽

X Ray Diffraction ◽

Depth Of Penetration ◽

X Ray ◽

The Past ◽

Transmission Electron ◽

Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

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