Structural characterization of MBE-grown HgSe:Fe layers: X-ray diffraction and Raman spectroscopy

2000 ◽  
Vol 214-215 ◽  
pp. 269-274 ◽  
Author(s):  
W. Szuszkiewicz ◽  
J. Bąk-Misiuk ◽  
E. Dynowska ◽  
M. Jouanne ◽  
J.F. Morhange ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Structural Characterization ◽  
X Ray Diffraction ◽  
X Ray

scholarly journals STRUCTURAL CHARACTERIZATION OF Co-DOPED ZnO NANOPARTICLES USING X-RAY DIFFRACTION AND RAMAN SPECTROSCOPY

2015 ◽  
Author(s):  
T. J. Castro ◽  
S. W. da Silva ◽  
F. Nakagomi ◽  
A. Franco Júnior ◽  
H. V. S. Pessoni ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Structural Characterization ◽  
Zno Nanoparticles ◽  
X Ray Diffraction ◽  
X Ray ◽  
Doped Zno ◽  
Co Doped

Structural Characterization of InAs/(GaIn)Sb Superlattices for IR Optoelectronics

1996 ◽  
Vol 421 ◽  
Author(s):  
J. Wagner ◽  
J. Schmitz ◽  
F. Fuchs ◽  
U. Weimar ◽  
N. Herres ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
High Resolution ◽  
Molecular Beam Epitaxy ◽  
Structural Characterization ◽  
Molecular Beam ◽  
Alloy Composition ◽  
Structural Quality ◽  
X Ray Diffraction ◽  
X Ray

AbstractWe report on the structural characterization of InAs/(GaIn)Sb superlattices (SL) grown by solid-source molecular-beam epitaxy. SL periodicity and overall structural quality were assessed by high-resolution X-ray diffraction and Raman spectroscopy. Spectroscopic ellipsometry was found to be sensitive to the (GaIn)Sb alloy composition.

scholarly journals Structural characterization of self-assembled quantum dot structures by X-ray diffraction techniques

1997 ◽  
Vol 306 (2) ◽  
pp. 198-204 ◽  
Author(s):  
A.A. Darhuber ◽  
J. Stangl ◽  
V. Holy ◽  
G. Bauer ◽  
A. Krost ◽  
...  
Keyword(s):  
Quantum Dot ◽  
Structural Characterization ◽  
X Ray Diffraction ◽  
X Ray ◽  
Self Assembled

Deposition of TRISO Particles With Superhard SiC Coatings and the Characterization of Anisotropy by Raman Spectroscopy

2009 ◽  
Vol 131 (4) ◽  
Author(s):  
E. López-Honorato ◽  
P. J. Meadows ◽  
J. Tan ◽  
Y. Xiang ◽  
P. Xiao
Keyword(s):  
Solid Solution ◽  
Raman Spectroscopy ◽  
Pyrolytic Carbon ◽  
X Ray Diffraction ◽  
X Ray ◽  
Flat Substrate ◽  
High Concentrations ◽  
Triso Particles ◽  
Sic Coatings

In this work we have deposited silicon carbide (SiC) at 1300°C with the addition of small amounts of propylene. The use of propylene and high concentrations of methyltrichlorosilane (9 vol %) allowed the deposition of superhard SiC coatings (42 GPa). The superhard SiC could result from the presence of a SiC–C solid solution, undetectable by X-ray diffraction but visible by Raman spectroscopy. Another sample obtained by the use of 50 vol % Argon, also showed the formation of SiC with good properties. The use of a flat substrate together with the particles showed the importance of carrying out the analysis on actual particles rather than in flat substrates. We show that it is possible to characterize the anisotropy of pyrolytic carbon by Raman spectroscopy.

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