Hot-carrier degradation mechanisms in silicon-On-Insulator MOSFETS

1997 ◽  
Vol 37 (7) ◽  
pp. 1003-1013 ◽  
Author(s):  
Sorin Cristoloveanu
Keyword(s):  
Silicon On Insulator ◽  
Degradation Mechanisms ◽  
Hot Carrier ◽  
Hot Carrier Degradation

New hot-carrier degradation mechanisms in 0.25 μm PMOSFETs

2002 ◽  
Author(s):  
R. Woltjer ◽  
G.M. Paulzen ◽  
H.G. Pomp ◽  
H. Lifka ◽  
P.H. Woerlee
Keyword(s):  
Degradation Mechanisms ◽  
Hot Carrier ◽  
Hot Carrier Degradation

Hot-Carrier Degradation Estimation of a Silicon-on-Insulator Tunneling FET Using Ambipolar Characteristics

2019 ◽  
Vol 40 (11) ◽  
pp. 1716-1719 ◽  
Author(s):  
Soo Cheol Kang ◽  
Donghwan Lim ◽  
Seok Jin Kang ◽  
Sang Kyung Lee ◽  
Changhwan Choi ◽  
...  
Keyword(s):  
Silicon On Insulator ◽  
Hot Carrier ◽  
Tunneling Fet ◽  
Hot Carrier Degradation

A review of hot-carrier degradation mechanisms in MOSFETs

1996 ◽  
Vol 36 (7-8) ◽  
pp. 845-869 ◽  
Author(s):  
Alexander Acovic ◽  
Giuseppe La Rosa ◽  
Yuan-Chen Sun
Keyword(s):  
Degradation Mechanisms ◽  
Hot Carrier ◽  
Hot Carrier Degradation
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