Precise optical path length measurement through an optical fiber: Application to seafloor strain monitoring

1997 ◽  
Vol 24 (6) ◽  
pp. 531-542 ◽  
Author(s):  
Mark A. Zumberge
2009 ◽  
Vol 48 (4) ◽  
pp. 704 ◽  
Author(s):  
Wojciech Lewoczko-Adamczyk ◽  
Max Schiemangk ◽  
Holger Müller ◽  
Achim Peters

Author(s):  
Mariangela Baggio ◽  
Aleksi Tamminen ◽  
Faezeh Zarrinkhat ◽  
Irina Nefedova ◽  
Arthur Aspelin ◽  
...  

2000 ◽  
Vol 627 ◽  
Author(s):  
Gabriel Popescu ◽  
Aristide Dogariu

ABSTRACTIn many industrial applications involving granular media, knowledge about the structural transformations suffered during the industrial process is desirable. Optical techniques are noninvasive, fast, and versatile tools for monitoring such transformations. We have recently introduced optical path-length spectroscopy as a new technique for random media investigation. The principle of the method is to use a partially coherent source in a Michelson interferometer, where the fields from a reference mirror and the sample are combined to obtain an interference signal. When the system under investigation is a multiple-scattering medium, by tuning the optical length of the reference arm, the optical path-length probability density of light backscattered from the sample is obtained. This distribution carries information about the structural details of the medium. In the present paper, we apply the technique of optical path-length spectroscopy to investigate inhomogeneous distributions of particulate dielectrics such as ceramics and powders. The experiments are performed on suspensions of systems with different solid loads, as well as on powders and suspensions of particles with different sizes. We show that the methodology is highly sensitive to changes in volume concentration and particle size and, therefore, it can be successfully used for real-time monitoring. In addition, the technique is fiber optic-based and has all the advantages associated with the inherent versatility.


2021 ◽  
Vol 11 (1) ◽  
Author(s):  
L. Clermont ◽  
W. Uhring ◽  
M. Georges

AbstractUnderstanding stray light (SL) is a crucial aspect in the development of high-end optical instruments, for instance space telescopes. As it drives image quality, SL must be controlled by design and characterized experimentally. However, conventional SL characterization methods are limited as they do not provide information on its origins. The problem is complex due to the diversity of light interaction processes with surfaces, creating various SL contributors. Therefore, when SL level is higher than expected, it can be difficult to determine how to improve the system. We demonstrate a new approach, ultrafast time-of-flight SL characterization, where a pulsed laser source and a streak camera are used to record individually SL contributors which travel with a specific optical path length. Furthermore, the optical path length offers a means of identification to determine its origin. We demonstrate this method in an imaging system, measuring and identifying individual ghosts and scattering components. We then show how it can be used to reverse-engineer the instrument SL origins.


Sign in / Sign up

Export Citation Format

Share Document