Surface studies of the reactivity of methyl, acetylene and atomic hydrogen at CVD diamond surfaces

1998 ◽  
Vol 399 (1) ◽  
pp. 1-14 ◽  
Author(s):  
J.S. Foord ◽  
K.P. Loh ◽  
R.B. Jackman
2000 ◽  
Vol 9 (3-6) ◽  
pp. 246-250 ◽  
Author(s):  
Simon Proffitt ◽  
Christopher H.B. Thompson ◽  
Aurora Gutierrez-Sosa ◽  
Nathan Paris ◽  
Nagindar K. Singh ◽  
...  

2001 ◽  
Vol 481 (1-3) ◽  
pp. L433-L436 ◽  
Author(s):  
A. Bergmaier ◽  
G. Dollinger ◽  
A. Aleksov ◽  
P. Gluche ◽  
E. Kohn

1994 ◽  
Vol 3 (4-6) ◽  
pp. 961-965 ◽  
Author(s):  
H. Kawarada ◽  
M. Aoki ◽  
H. Sasaki ◽  
K. Tsugawa
Keyword(s):  

2007 ◽  
Vol 1039 ◽  
Author(s):  
Ken Haenen ◽  
Andrada Lazea ◽  
Vincent Mortet ◽  
Jan D'Haen ◽  
Peter Geithner ◽  
...  

AbstractPhosphorous-doping of predominantly (110) oriented polycrystalline CVD diamond films is presented. Incorporation of phosphorous into the diamond grains was accomplished by using novel microwave plasma enhanced chemical vapor deposition (MW PE CVD) growth conditions. The substitutional nature of the phosphorous atom was confirmed by applying the quasi-steady-state photocurrent technique (PC) and cathodoluminescence (CL) measurements at low temperature. Topographical information and the relation between substrate and P-doped film grain orientation was obtained with scanning electron microscopy (SEM) and electron back-scattered diffraction (EBSD). The optimized growth parameters for P-doped layers on (110) oriented polycrystalline diamond differ substantially from the standard conditions reported in literature for P-doping of single crystalline (111) and (100) oriented diamond surfaces.


1994 ◽  
Vol 9 (6) ◽  
pp. 1546-1551 ◽  
Author(s):  
Darin S. Olson ◽  
Michael A. Kelly ◽  
Sanjiv Kapoor ◽  
Stig B. Hagstrom

We describe a growth mechanism of CVD diamond films consisting of a series of surface reactions. It is derived from experimental observations of a sequential deposition process in which incident carbon flux and atomic hydrogen flux were independently varied. In this sequential process, film growth rate increased with atomic hydrogen exposure, and a saturation in the utilization of carbon was observed. These features are consistent with a surface growth process consisting of the following steps: (i) the carburization of the diamond surface, (ii) the deposition of highly disordered carbon on top of this surface, (iii) the etching of disordered carbon by atomic hydrogen, (iv) the conversion of the carburized diamond surface to diamond at growth sites by atomic hydrogen, and (v) the carburization of newly grown diamond surface. The nature of the growth sites on the diamond surface has not been determined experimentally, and the existence of the carburized surface layer has not been demonstrated experimentally. The surface growth mechanism is the only one consistent with the growth observed in conventional diamond reactors and the sequential reactor, while precluding the necessity of gas phase precursors.


1995 ◽  
Vol 270 (1-2) ◽  
pp. 200-204 ◽  
Author(s):  
G. Francz ◽  
P. Reinke ◽  
P. Oelhafen ◽  
W. Hänni

2000 ◽  
Vol 621 ◽  
Author(s):  
F.A.M. Köck ◽  
J.M. Garguilo ◽  
B. Brown ◽  
R.J. Nemanich

ABSTRACTImaging of field emission and photoemission from diamond surfaces is accomplished with a high resolution photo-electron emission microscope (PEEM). Measurements obtained as a function of sample temperature up to 1000°C display thermionic field emission images (TFEEM). The system can also record the emission current versus applied voltage. N-doped diamond films have been produced by MPCVD with a N/C gas phase ratio of 48. The surfaces display uniform emission in PEEM at all temperatures. No FEEM images are detectable below 500°C. At ∼680°C the T-FEEM and PEEM images are nearly identical in intensity and uniformity. This is to be contrasted with other carbon based cold cathodes in which the emission is observed from only a low density of highly emitting sites. The I/V measurements obtained from the N-doped films in the T-FEEM configuration show a component that depends linearly on voltage at low fields. At higher fields, an approximately exponential dependence is observed. At low temperatures employed (<700°C), the results indicate a thermionic component to the emitted current.


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