Simultaneous observation of scanning tunneling microscopy and reflection electron microscopy image of the Si(111)7×7 surface

1999 ◽  
Vol 433-435 ◽  
pp. 627-631 ◽  
Author(s):  
Yoshitaka Naitoh ◽  
Kunio Takayanagi ◽  
Hiroyuki Hirayama ◽  
Yoshifumi Ohsima
1992 ◽  
Vol 47 (12) ◽  
pp. 1187-1190 ◽  
Author(s):  
T. Schilling ◽  
B. Tesche ◽  
G. Lehmpfuhl

Abstract Scanning tunneling microscopy (STM) of Au(100) was performed in air with a NanoScope II. Regions of 150 x 150 nm with atomatically flat areas fragmented by atomic steps were observed. The reconstructed (100) surface, deformed to a twisted hexagon with an interatomic distance of 0.27 μ ± 0.02 nm, could be seen and a corrugation of about 0.05 nm depth was measured. These results are in good agreement with Reflection Electron Microscopy measurements and STM investigations in UHV.


2011 ◽  
Vol 98 (26) ◽  
pp. 263103 ◽  
Author(s):  
Xiongwen Chen ◽  
Haiqing Wan ◽  
Kehui Song ◽  
Dongsheng Tang ◽  
Guanghui Zhou

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