X-Ray diffraction line broadening by stacking faults in SrBi2Nb2O9/SrTiO3 epitaxial thin films

2001 ◽  
Vol 391 (1) ◽  
pp. 42-46 ◽  
Author(s):  
A. Boulle ◽  
C. Legrand ◽  
R. Guinebretière ◽  
J.P. Mercurio ◽  
A. Dauger
Keyword(s):  
Thin Films ◽  
Stacking Faults ◽  
Diffraction Line ◽  
Epitaxial Thin Films ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
X Ray

scholarly journals X-ray diffraction line broadening by stacking faults in SrBi2Nb2O9/SrTiO3epitaxial thin films

2000 ◽  
Vol 56 (s1) ◽  
pp. s399-s399
Author(s):  
A. Boulle ◽  
C. Legrand ◽  
R. Guinebretière ◽  
J. P. Mercurio ◽  
A. Dauger
Keyword(s):  
Thin Films ◽  
Stacking Faults ◽  
Diffraction Line ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
X Ray

X-Ray Diffraction Line Broadening from Gold and Platinum Thin Films

2001 ◽  
Vol 378-381 ◽  
pp. 358-363
Author(s):  
P.A. Lynch ◽  
Robert W. Cheary ◽  
E. Dooryhée ◽  
N. Armstrong ◽  
C. Tang
Keyword(s):  
Thin Films ◽  
Diffraction Line ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
X Ray

Interference phenomena observed by X-ray diffraction in nanocrystalline thin films

2004 ◽  
Vol 37 (4) ◽  
pp. 613-620 ◽  
Author(s):  
David Rafaja ◽  
Volker Klemm ◽  
Gerhard Schreiber ◽  
Michael Knapp ◽  
Radomír Kužel
Keyword(s):  
Thin Films ◽  
Reciprocal Lattice ◽  
Preferred Orientation ◽  
Lattice Points ◽  
Partial Coherence ◽  
Diffraction Line ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
X Ray ◽  
Nanocrystalline Thin Films

An increase of the X-ray diffraction line broadening with increasing diffraction angle was observed experimentally in nanocrystalline thin films. Such a change of the line width is usually related to the microstrain in the sample, which, however, contradicts the assumptions that the microstrain is relatively low in nanocrystalline materials and that the line broadening is caused mainly by small crystallite size. For nanocrystalline thin films, the observed changes in the diffraction line broadening are explained by a partial coherence of adjacent crystallites, which is stronger at low diffraction angles than at high diffraction angles. Furthermore, it is found that the degree of coherence of the adjacent crystallites depends on their size and preferred orientation. Smaller crystallites show better coherence, because the corresponding reciprocal-lattice points are broadened compared with those related to large crystallites. A strong preferred orientation improves further the coherence of the adjacent crystallites. Theoretical results are confirmed by experimental data obtained on nanocrystalline (Ti,Al)N thin films using a combination of glancing-angle X-ray diffraction, high-resolution transmission electron microscopy and X-ray texture analysis.

Investigation of Residual Strains of the Second Kind in Plastically Deformed Metallic Materials

1994 ◽  
Vol 376 ◽  
Author(s):  
M. Vrána ◽  
P. Klimanek ◽  
T. Kschidock ◽  
P. Lukáš ◽  
P. Mikula
Keyword(s):  
High Resolution ◽  
Neutron Diffraction ◽  
Stacking Faults ◽  
Metallic Materials ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
X Ray ◽  
Neutron Diffractometer ◽  
Residual Strains ◽  
Good Agreement

ABSTRACTInvestigation of strongly distorted crystal structures caused by dislocations, stacking-faults etc. in both plastically deformed f.c.c. and b.c.c. metallic materials was performed by the analysis of the neutron diffraction line broadening. Measurements were realized by means of the high resolution triple-axis neutron diffractometer equipped by bent Si perfect crystals as monochromator and analyzer at the NPI Řež. The substructure parameters obtained in this manner are in good agreement with the results of X-ray diffraction analysis.

X-ray diffraction line broadening on vibrating dry-milled Two Crows sepiolite

2006 ◽  
Vol 54 (3) ◽  
pp. 390-401 ◽  
Author(s):  
Joaquin Bastida ◽  
Marek A. Kojdecki ◽  
Pablo Pardo ◽  
Pedro Amorós
Keyword(s):  
Diffraction Line ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
X Ray
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