Computer simulation of surface atom ejection by ion impact

Vacuum ◽  
1976 ◽  
Vol 26 (8) ◽  
pp. 358
2002 ◽  
Vol 158-159 ◽  
pp. 277-280 ◽  
Author(s):  
A.A. Dzhurakhalov ◽  
S. Rahmatov

1975 ◽  
Vol 53 (16) ◽  
pp. 1513-1523 ◽  
Author(s):  
D. P. Jackson

Surface atom ejection, an essential component of single crystal sputtering phenomena, is investigated for a realistic surface model using computer simulation. The dynamics of ejection are analyzed in terms of the collective attractive field of the surface and binary repulsive collisions of the ejected atom with its neighbors in the surface. In-surface correlated collision sequences initiated by ejection are also discussed in detail. It is found that ejection from the surface layer is a fundamentally anisotropic process exhibiting a complex range of interaction types.


1999 ◽  
Vol 59 (10) ◽  
pp. 6650-6660 ◽  
Author(s):  
David Saada ◽  
Joan Adler ◽  
R. Kalish

Author(s):  
O. T. Inal ◽  
L. E. Murr

When sharp metal filaments of W, Fe, Nb or Ta are observed in the field-ion microscope (FIM), their appearance is differentiated primarily by variations in regional brightness. This regional brightness, particularly prominent at liquid nitrogen temperature has been attributed in the main to chemical specificity which manifests itself in a paricular array of surface-atom electron-orbital configurations.Recently, anomalous image brightness and streaks in both fcc and bee materials observed in the FIM have been shown to be the result of surface asperities and related topographic features which arise by the unsystematic etching of the emission-tip end forms.


Author(s):  
Kiyomichi Nakai ◽  
Yusuke Isobe ◽  
Chiken Kinoshita ◽  
Kazutoshi Shinohara

Induced spinodal decomposition under electron irradiation in a Ni-Au alloy has been investigated with respect to its basic mechanism and confirmed to be caused by the relaxation of coherent strain associated with modulated structure. Modulation of white-dots on structure images of modulated structure due to high-resolution electron microscopy is reduced with irradiation. In this paper the atom arrangement of the modulated structure is confirmed with computer simulation on the structure images, and the relaxation of the coherent strain is concluded to be due to the reduction of phase-modulation.Structure images of three-dimensional modulated structure along <100> were taken with the JEM-4000EX high-resolution electron microscope at the HVEM Laboratory, Kyushu University. The transmitted beam and four 200 reflections with their satellites from the modulated structure in an fee Ni-30.0at%Au alloy under illumination of 400keV electrons were used for the structure images under a condition of the spherical aberration constant of the objective lens, Cs = 1mm, the divergence of the beam, α = 3 × 10-4 rad, underfocus, Δf ≃ -50nm and specimen thickness, t ≃ 15nm. The CIHRTEM code was used for the simulation of the structure image.


2019 ◽  
Vol 3 (6) ◽  
pp. 723-729
Author(s):  
Roslyn Gleadow ◽  
Jim Hanan ◽  
Alan Dorin

Food security and the sustainability of native ecosystems depends on plant-insect interactions in countless ways. Recently reported rapid and immense declines in insect numbers due to climate change, the use of pesticides and herbicides, the introduction of agricultural monocultures, and the destruction of insect native habitat, are all potential contributors to this grave situation. Some researchers are working towards a future where natural insect pollinators might be replaced with free-flying robotic bees, an ecologically problematic proposal. We argue instead that creating environments that are friendly to bees and exploring the use of other species for pollination and bio-control, particularly in non-European countries, are more ecologically sound approaches. The computer simulation of insect-plant interactions is a far more measured application of technology that may assist in managing, or averting, ‘Insect Armageddon' from both practical and ethical viewpoints.


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