Modeling of Irradiation-Induced Changes in the Electrical Properties of Metal-Oxide-Semiconductor Structures

Author(s):  
J.N. Churchill ◽  
F.E. Holmstrom ◽  
T.W. Collins
2020 ◽  
Vol 172 ◽  
pp. 107881 ◽  
Author(s):  
Onoriode N. Ogidi-Ekoko ◽  
Justin C. Goodrich ◽  
Alexandra J. Howzen ◽  
Matthew R. Peart ◽  
Nicholas C. Strandwitz ◽  
...  

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