ScienceGate
Advanced Search
Author Search
Journal Finder
Blog
Sign in / Sign up
ScienceGate
Search
Author Search
Journal Finder
Blog
Sign in / Sign up
Application of High Resolution FTIR Spectroscopy in Structural Characterization of Polyethylene and Ethylene Copolymers
Studies in Surface Science and Catalysis - Progress in Olefin Polymerization Catalysts and Polyolefin Materials
◽
10.1016/s0167-2991(06)80430-1
◽
2006
◽
pp. 31-34
Author(s):
Zhiqiang Su
◽
Xiuqin Zhang
◽
Ning Kang
◽
Yizhuang Xu
◽
Ying Zhao
◽
...
Keyword(s):
High Resolution
◽
Ftir Spectroscopy
◽
Structural Characterization
◽
Ethylene Copolymers
Download Full-text
Related Documents
Cited By
References
Structural characterization of trimethylsilyl methyl glycosides derivatives by high-resolution mass spectrometry, linked scans and MIKE experiments
Analytical and Bioanalytical Chemistry
◽
10.1007/s00216-008-1915-1
◽
2008
◽
Vol 390
(7)
◽
pp. 1853-1860
◽
Cited By ~ 2
Author(s):
Corinne Loutelier-Bourhis
◽
Muriel Bardor
◽
Catherine M. Lange
Keyword(s):
Mass Spectrometry
◽
High Resolution
◽
Structural Characterization
◽
High Resolution Mass Spectrometry
◽
High Resolution Mass
◽
Resolution Mass
Download Full-text
Measurement of the variation of crystal lattice structures of ethylene copolymers with high-resolution cryogenic FTIR spectroscopy
Journal of Applied Polymer Science
◽
10.1002/app.33825
◽
2011
◽
Vol 121
(4)
◽
pp. 2072-2077
Author(s):
Zhiqiang Su
◽
Qing Li
◽
Li Cao
◽
Xiaonong Chen
Keyword(s):
High Resolution
◽
Crystal Lattice
◽
Ftir Spectroscopy
◽
Lattice Structures
◽
Ethylene Copolymers
Download Full-text
Structural characterization of polypyrrole in the solid state by high resolution 15N NMR spectroscopy combined with quantum chemistry
Journal of Molecular Structure
◽
10.1016/0022-2860(92)80015-a
◽
1992
◽
Vol 269
(1-2)
◽
pp. 183-195
◽
Cited By ~ 25
Author(s):
Mizuyo Kikuchi
◽
Hiromichi Kurosu
◽
Isao Ando
Keyword(s):
Solid State
◽
Nmr Spectroscopy
◽
High Resolution
◽
Quantum Chemistry
◽
Structural Characterization
◽
15N Nmr
◽
15N Nmr Spectroscopy
Download Full-text
High-Resolution X-Ray Diffraction Techniques for Structural Characterization of Silicon and Other Advanced Materials
Crystal Growth Technology
◽
10.1002/0470871687.ch5
◽
2004
◽
pp. 93-114
Author(s):
Krishan Lal
Keyword(s):
High Resolution
◽
Structural Characterization
◽
Advanced Materials
◽
X Ray Diffraction
◽
X Ray
Download Full-text
Structural Characterization of Zeolites by High Resolution Magic-Angle-Spinning Solid State 29Si-NMR Spectroscopy
Zeolites: Science and Technology
◽
10.1007/978-94-009-6128-9_7
◽
1984
◽
pp. 193-210
◽
Cited By ~ 5
Author(s):
Zelimir Gabelica
◽
Janos B. Nagy
◽
Philippe Bodart
◽
Guy Debras
◽
Eric G. Derouane
◽
...
Keyword(s):
Solid State
◽
Nmr Spectroscopy
◽
High Resolution
◽
Structural Characterization
◽
Magic Angle Spinning
◽
Magic Angle
◽
29Si Nmr
◽
Angle Spinning
◽
29Si Nmr Spectroscopy
Download Full-text
Detection and structural characterization of the metabolites of dihydroresveratrol in rats by liquid chromatography coupled to high resolution tandem mass spectrometry
Rapid Communications in Mass Spectrometry
◽
10.1002/rcm.8991
◽
2020
◽
Author(s):
Qiang‐Guo Ji
◽
Ming‐Hua Ma
◽
Xue‐Mei Hu
◽
Yi‐Jun Zhang
◽
Xiao‐Hong Xu
◽
...
Keyword(s):
Mass Spectrometry
◽
Liquid Chromatography
◽
High Resolution
◽
Tandem Mass Spectrometry
◽
Structural Characterization
◽
Tandem Mass
Download Full-text
Structural Characterization of Epitaxial YBa2Cu3O7 Thin Films on Step-Edge Substrates by Means of High-Resolution Electron Mcroscopy
Materials Science Forum
◽
10.4028/www.scientific.net/msf.129.99
◽
1993
◽
Vol 129
◽
pp. 99-118
Author(s):
C.L. Jia
◽
B. Kabius
◽
K. Urban
Keyword(s):
Thin Films
◽
High Resolution
◽
Structural Characterization
◽
Step Edge
◽
Resolution Electron
Download Full-text
Structural characterization of plasma-doped silicon by high resolution x-ray diffraction
Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena
◽
10.1116/1.587334
◽
1994
◽
Vol 12
(2)
◽
pp. 951
◽
Cited By ~ 14
Author(s):
D. L. Chapek
Keyword(s):
High Resolution
◽
Structural Characterization
◽
X Ray Diffraction
◽
X Ray
◽
Doped Silicon
Download Full-text
Structural Characterization of the Si(111)-CaF2Interface by High-Resolution Transmission Electron Microscopy
Physical Review Letters
◽
10.1103/physrevlett.61.2973.2
◽
1988
◽
Vol 61
(26)
◽
pp. 2973-2973
Author(s):
R. M. Tromp
◽
F. K. LeGoues
◽
W. Krakow
◽
L. J. Schowalter
Keyword(s):
Electron Microscopy
◽
Transmission Electron Microscopy
◽
High Resolution
◽
Structural Characterization
◽
Transmission Electron
Download Full-text
High-Resolution Structural Characterization of Two Layered Aluminophosphates by Synchrotron Powder Diffraction and NMR Crystallographies
Chemistry of Materials
◽
10.1021/cm4004799
◽
2013
◽
Vol 25
(11)
◽
pp. 2227-2242
◽
Cited By ~ 27
Author(s):
Boris Bouchevreau
◽
Charlotte Martineau
◽
Caroline Mellot-Draznieks
◽
Alain Tuel
◽
Matthew R. Suchomel
◽
...
Keyword(s):
High Resolution
◽
Powder Diffraction
◽
Structural Characterization
◽
Synchrotron Powder Diffraction
Download Full-text
Sign in / Sign up
Close
Export Citation Format
Close
Share Document
Close