PO-1682 Towards a clinical helium ion imaging system

2021 ◽  
Vol 161 ◽  
pp. S1407-S1408
Author(s):  
L. Volz ◽  
T. Vichtl ◽  
C. Collins-Fekete ◽  
J. Seco
Keyword(s):  
Imaging System ◽  
Ion Imaging ◽  
Helium Ion

Contrast Mechanisms and Image Formation in Helium Ion Microscopy

2009 ◽  
Vol 15 (2) ◽  
pp. 147-153 ◽  
Author(s):  
David C. Bell
Keyword(s):  
Imaging System ◽  
Ion Source ◽  
Ion Imaging ◽  
Small Surface ◽  
Surface Sensitivity ◽  
Helium Ion ◽  
Contrast Mechanisms ◽  
Ion Microscopy ◽  
Imaging Instrument ◽  
Enhanced Surface

AbstractThe helium ion microscope is a unique imaging instrument. Based on an atomic level imaging system using the principle of field ion microscopy, the helium ion source has been shown to be incredibly stable and reliable, itself a remarkable engineering feat. Here we show that the image contrast is fundamentally different to other microscopes such as the scanning electron microscope (SEM), although showing many operational similarities due to the physical ion interaction mechanisms with the sample. Secondary electron images show enhanced surface contrast due the small surface interaction volume as well as elemental contrast differences, such as for nanowires imaged on a substrate. We present images of nanowires and nanoparticles for comparison with SEM imaging. Applications of Rutherford backscattered ion imaging as a unique and novel imaging mechanism are described. The advantages of the contrast mechanisms offered by this instrument for imaging nanomaterials are clearly apparent due to the high resolution and surface sensitivity afforded in the images. Future developments of the helium ion microscope should yield yet further improvements in imaging and provide a platform for continued advances in microscope science and nanoscale research.

The Helium Ion Microscope for High Resolution Imaging, Materials Analysis, Circuit Edit and FA Applications

2009 ◽  
Author(s):  
William B. Thompson ◽  
John Notte ◽  
Larry Scipioni ◽  
Mohan Ananth ◽  
Lewis Stern ◽  
...  
Keyword(s):  
Ion Source ◽  
Injection System ◽  
Analysis Tool ◽  
High Resolution Imaging ◽  
Ion Imaging ◽  
Materials Analysis ◽  
Ion Optics ◽  
Helium Ion ◽  
Scanning Transmission ◽  
Resolution Imaging

Abstract Currently, the helium ion microscope (HIM) can be operated in three imaging modes; ion induced secondary electron (SE) mode, Rutherford backscatter imaging (RBI) mode, and scanning transmission ion imaging (STIM) mode. This paper will provide an overview of microscope’s ion source, its ion optics, the system architecture, the fundamentals of these three imaging modes and many FA related examples. Recently integrated with the microscope are a Rutherford Backscatter (RBS) detector for materials analysis and a gas injection system (GIS) for material modification. We will describe this new hardware and suggest how these additions could also contribute to the helium ion microscope being an important failure analysis tool.

scholarly journals Electron and Helium Ion Imaging of Arabidopsis Affected by Genetic Mutation and Thermochemical Treatment for Biofuel Applications

2014 ◽  
Vol 20 (S3) ◽  
pp. 1338-1339 ◽  
Author(s):  
A. E. Curtin ◽  
A. N. Chiaramonti ◽  
A. W. Sanders ◽  
P. N. Ciesielski ◽  
C. Chapple ◽  
...  
Keyword(s):  
Thermochemical Treatment ◽  
Genetic Mutation ◽  
Ion Imaging ◽  
Helium Ion

scholarly journals MeV Helium Ion Imaging of Gold Nanoparticles in Whole Cells

2011 ◽  
Vol 17 (S2) ◽  
pp. 662-663
Author(s):  
C Xiao ◽  
R Minqin ◽  
C Ce-Belle ◽  
C Udalagama ◽  
A Bettiol ◽  
...  
Keyword(s):  
Gold Nanoparticles ◽  
Ion Imaging ◽  
Whole Cells ◽  
Helium Ion

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

The effect of neon on helium ion imaging in the field ion microscope

1972 ◽  
Vol 33 (3) ◽  
pp. 553-564 ◽  
Author(s):  
A.P. Janssen ◽  
J.P. Jones
Keyword(s):  
Ion Imaging ◽  
Helium Ion ◽  
Field Ion Microscope

Improvement of the spatial resolution of ion imaging system using thinned sensor substrate

2020 ◽  
Author(s):  
Wataru Inami ◽  
Kiyohisa Nii ◽  
Satoru Shibano ◽  
Hikaru Tomita ◽  
Yohimasa Kawata
Keyword(s):  
Spatial Resolution ◽  
Imaging System ◽  
Ion Imaging

The application of SIMS ion imaging techniques in the experimental study of fluid-mineral interactions

1991 ◽  
Vol 55 (380) ◽  
pp. 347-356 ◽  
Author(s):  
S. C. Elphick ◽  
C. M. Graham ◽  
F. D. L. Walker ◽  
M. B. Holness
Keyword(s):  
Dynamic Range ◽  
Imaging System ◽  
Imaging Techniques ◽  
Ion Beam ◽  
Sample Surface ◽  
Primary Beam ◽  
Ion Imaging ◽  
Isotopic Tracers ◽  
Hydrothermal Experiments ◽  
Mineral Interaction

AbstractIon imaging by SIMS (ion microprobe) techniques provides a novel approach to the identification of mechanisms of fluid-mineral interaction during hydrothermal experiments. In scanning ion imaging, the primary ion beam is focussed to a fine spot which is rastered across the polished sample surface, and the secondary ion signal from the mass spectrometer is synchronised with the primary beam. The resistive anode encoder provides a direct ion image of a sample surface illuminated by a defocussed primary beam. The latter system is susceptible to charging artifacts during the imaging of insulating geological materials, and has a lower dynamic range than the scanning ion imaging system.Application of both systems to the study of fluid–mineral interaction during hydrothermal experiments are reviewed in which fluid or solid phases have been labelled with 18O-enriched isotopic tracers. These include studies of micropermeability and microporosity in feldspars, solid-state diffusion versus solution-reprecipitation, textural equilibration mechanisms, and oxygen isotope exchange in silicate–carbonate systems.

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