The effect of neon on helium ion imaging in the field ion microscope

Abstract Currently, the helium ion microscope (HIM) can be operated in three imaging modes; ion induced secondary electron (SE) mode, Rutherford backscatter imaging (RBI) mode, and scanning transmission ion imaging (STIM) mode. This paper will provide an overview of microscope’s ion source, its ion optics, the system architecture, the fundamentals of these three imaging modes and many FA related examples. Recently integrated with the microscope are a Rutherford Backscatter (RBS) detector for materials analysis and a gas injection system (GIS) for material modification. We will describe this new hardware and suggest how these additions could also contribute to the helium ion microscope being an important failure analysis tool.

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Electron and Helium Ion Imaging of Arabidopsis Affected by Genetic Mutation and Thermochemical Treatment for Biofuel Applications

Microscopy and Microanalysis ◽

10.1017/s1431927614008423 ◽

2014 ◽

Vol 20 (S3) ◽

pp. 1338-1339 ◽

Cited By ~ 1

Author(s):

A. E. Curtin ◽

A. N. Chiaramonti ◽

A. W. Sanders ◽

P. N. Ciesielski ◽

C. Chapple ◽

...

Keyword(s):

Thermochemical Treatment ◽

Genetic Mutation ◽

Ion Imaging ◽

Helium Ion

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MeV Helium Ion Imaging of Gold Nanoparticles in Whole Cells

Microscopy and Microanalysis ◽

10.1017/s1431927611004181 ◽

2011 ◽

Vol 17 (S2) ◽

pp. 662-663

Author(s):

C Xiao ◽

R Minqin ◽

C Ce-Belle ◽

C Udalagama ◽

A Bettiol ◽

...

Keyword(s):

Gold Nanoparticles ◽

Ion Imaging ◽

Whole Cells ◽

Helium Ion

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

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PO-1682 Towards a clinical helium ion imaging system

Radiotherapy and Oncology ◽

10.1016/s0167-8140(21)08133-0 ◽

2021 ◽

Vol 161 ◽

pp. S1407-S1408

Author(s):

L. Volz ◽

T. Vichtl ◽

C. Collins-Fekete ◽

J. Seco

Keyword(s):

Imaging System ◽

Ion Imaging ◽

Helium Ion

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A New Fast Helium Ion Imaging Technique Through Rapid Acquiring and Restoring Using the Point Spread Function Deconvolution Method

Microscopy and Microanalysis ◽

10.1017/s1431927620019133 ◽

2020 ◽

Vol 26 (S2) ◽

pp. 1728-1731

Author(s):

Pouya Tavousi ◽

Bahar Ahmadi ◽

Nicholas May ◽

Sunshine Snider-Drysdale ◽

Zahra Shahbazi ◽

...

Keyword(s):

Point Spread Function ◽

Imaging Technique ◽

Deconvolution Method ◽

Ion Imaging ◽

Point Spread ◽

Helium Ion ◽

Spread Function

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The impact of secondary fragments on the image quality of helium ion imaging

Physics in Medicine and Biology ◽

10.1088/1361-6560/aadf25 ◽

2018 ◽

Vol 63 (19) ◽

pp. 195016 ◽

Cited By ~ 13

Author(s):

Lennart Volz ◽

Pierluigi Piersimoni ◽

Vladimir A Bashkirov ◽

Stephan Brons ◽

Charles-Antoine Collins-Fekete ◽

...

Keyword(s):

Image Quality ◽

Ion Imaging ◽

Helium Ion ◽

The Impact

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Contrast Mechanisms and Image Formation in Helium Ion Microscopy

Microscopy and Microanalysis ◽

10.1017/s1431927609090138 ◽

2009 ◽

Vol 15 (2) ◽

pp. 147-153 ◽

Cited By ~ 91

Author(s):

David C. Bell

Keyword(s):

Imaging System ◽

Ion Source ◽

Ion Imaging ◽

Small Surface ◽

Surface Sensitivity ◽

Helium Ion ◽

Contrast Mechanisms ◽

Ion Microscopy ◽

Imaging Instrument ◽

Enhanced Surface

AbstractThe helium ion microscope is a unique imaging instrument. Based on an atomic level imaging system using the principle of field ion microscopy, the helium ion source has been shown to be incredibly stable and reliable, itself a remarkable engineering feat. Here we show that the image contrast is fundamentally different to other microscopes such as the scanning electron microscope (SEM), although showing many operational similarities due to the physical ion interaction mechanisms with the sample. Secondary electron images show enhanced surface contrast due the small surface interaction volume as well as elemental contrast differences, such as for nanowires imaged on a substrate. We present images of nanowires and nanoparticles for comparison with SEM imaging. Applications of Rutherford backscattered ion imaging as a unique and novel imaging mechanism are described. The advantages of the contrast mechanisms offered by this instrument for imaging nanomaterials are clearly apparent due to the high resolution and surface sensitivity afforded in the images. Future developments of the helium ion microscope should yield yet further improvements in imaging and provide a platform for continued advances in microscope science and nanoscale research.

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Field-Ion Microscopy of BCC Metals: A Study of Image Differences and Topographical Variations

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100071016 ◽

1973 ◽

Vol 31 ◽

pp. 114-115

Author(s):

O. T. Inal ◽

L. E. Murr

Keyword(s):

Liquid Nitrogen ◽

Liquid Nitrogen Temperature ◽

Surface Atom ◽

Image Brightness ◽

Field Ion Microscopy ◽

Topographic Features ◽

Bcc Metals ◽

Electron Orbital ◽

Ion Microscopy ◽

Field Ion Microscope

When sharp metal filaments of W, Fe, Nb or Ta are observed in the field-ion microscope (FIM), their appearance is differentiated primarily by variations in regional brightness. This regional brightness, particularly prominent at liquid nitrogen temperature has been attributed in the main to chemical specificity which manifests itself in a paricular array of surface-atom electron-orbital configurations.Recently, anomalous image brightness and streaks in both fcc and bee materials observed in the FIM have been shown to be the result of surface asperities and related topographic features which arise by the unsystematic etching of the emission-tip end forms.

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