Oxide thickness dependence of hole trap generation in MOS structures under high-field electron injection
1997 ◽
Vol 36
(1-4)
◽
pp. 161-164
◽
Keyword(s):
2015 ◽
Vol 128
(5)
◽
pp. 887-890
◽
Keyword(s):
Keyword(s):
Keyword(s):
Keyword(s):
2002 ◽
Vol 42
(9-11)
◽
pp. 1461-1464
◽
2016 ◽
Vol 10
(2)
◽
pp. 450-454
◽
Keyword(s):
Keyword(s):