Monte Carlo simulation of kinetic electron emission from metal due to impact of heavy ions

1999 ◽  
Vol 153 (1-4) ◽  
pp. 42-46 ◽  
Author(s):  
J Kawata ◽  
K Ohya
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Electron Emission ◽  
Heavy Ions

Charge States of Heavy Ions with Energy in the MeV Range in Crystalline Semiconductor Targets

1989 ◽  
Vol 157 ◽  
Author(s):  
A.M. Mazzone
Keyword(s):  
Monte Carlo Simulation ◽  
Gallium Arsenide ◽  
Monte Carlo ◽  
Heavy Ions ◽  
Random Orientation ◽  
Crystalline Semiconductor ◽  
Charge States

ABSTRACTIn this work a formalism for the evaluation of electronic losses of heavy ions with energy of few MeV in crystalline semiconductor targets is presented. The stopping values are used in a Monte Carlo simulation to calculate the ion range in silicon and in gallium arsenide for a random orientation of the target and under channelling conditions.

Fast Monte Carlo simulation of DNA damage induction by Auger-electron emission

2014 ◽  
Vol 90 (5) ◽  
pp. 392-400 ◽  
Author(s):  
Ya-Yun Hsiao ◽  
Tzu-Hsiang Hung ◽  
Shu-Ju Tu ◽  
Chuan-Jong Tung
Keyword(s):  
Dna Damage ◽  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Electron Emission ◽  
Auger Electron

Monte Carlo simulation of electron emission induced by swift highly charged ions: beyond the linear response approximation

2002 ◽  
Vol 21 (2) ◽  
pp. 125-135 ◽  
Author(s):  
M. Beuve ◽  
M. Caron ◽  
P.D. Fainstein ◽  
M. Galassi ◽  
B. Gervais ◽  
...  
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Electron Emission ◽  
Linear Response ◽  
Highly Charged Ions ◽  
Charged Ions
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