XPS characterization of xα-Fe2O3–(1−x)ZrO2 for oxygen gas sensing application

2002 ◽  
Vol 75 (1-3) ◽  
pp. 67-70 ◽  
Author(s):  
W. Cao ◽  
O.K. Tan ◽  
J.S. Pan ◽  
W. Zhu ◽  
C.V. Gopal Reddy
2021 ◽  
Vol 258 ◽  
pp. 117643
Author(s):  
Nour S. Abdel Rahman ◽  
Yaser E. Greish ◽  
Saleh T. Mahmoud ◽  
Naser N. Qamhieh ◽  
Hesham F. El-Maghraby ◽  
...  

1999 ◽  
Author(s):  
Yongxiang Li ◽  
Muralihar K. Ghantasala ◽  
Kosmas Galatsis ◽  
Wojtek Wlodarski

2018 ◽  
Vol 34 (1-2) ◽  
pp. 66-73
Author(s):  
A. Ouerdane ◽  
M. Ghaffour ◽  
Z. Hachoun ◽  
M. Abdelkrim ◽  
M. Bedrouni ◽  
...  

2017 ◽  
Vol 376 (1) ◽  
pp. 1700006 ◽  
Author(s):  
Neeru Sharma ◽  
Vikas Sharma ◽  
Yachana Jain ◽  
Mitlesh Kumari ◽  
Ragini Gupta ◽  
...  

RSC Advances ◽  
2014 ◽  
Vol 4 (98) ◽  
pp. 54953-54959 ◽  
Author(s):  
Rishi Vyas ◽  
Pawan Kumar ◽  
Jaya Dwivedi ◽  
Sarla Sharma ◽  
Shabana Khan ◽  
...  

Successful demonstration of Fe-doped ZnO nanowires using a facile vapour phase transport synthesis method for high-performance oxygen gas sensing application.


1998 ◽  
Vol 526 ◽  
Author(s):  
R. Machorro ◽  
G. Soto ◽  
E. C. Samano ◽  
L. Cota-Araiza

AbstractInhomogeneous low-k thin films of SiOxNy have been deposited by laser ablation of a Si3N4 sintered target in presence of oxygen gas. The high oxidation rate of silicon nitride has been used to control the stoichiometry of the films by modifying the oxygen partial pressure. The refractive index of the deposited material was able to be tailored at any value between 1.47 (SiO2) to 2.03 (Si3N4) by this approach. In situ optical characterization of the growing films was possible using kinetic and spectro ellipsometry. The refractive index was determined by applying the Effective Medium Approximation (EMA) and considering a mixture of SiO2, Si3N4, and voids. The volumetric composition obtained by ellipsometry was compared to the results determined by AES and XPS characterization. The purpose of this application is to show that reactive PLD can be used to produce high quality optical filters.


2007 ◽  
Vol 124-126 ◽  
pp. 223-226 ◽  
Author(s):  
Md. Mosharaf Hossain Bhuiyan ◽  
Tsuyoshi Ueda ◽  
Tomoaki Ikegami

SnO2 thin films have been grown on Si3N4 substrates and also on Al2O3 sensor substrates with Pt interdigitated electrodes by the pulsed excimer laser deposition (PLD). Palladium doped SnO2 thin film was also prepared by the PLD method combined with the DC sputtering process. The substrate temperature and the oxygen gas pressure were changed from 300 to 500°C and from 100 to 300 mTorr, respectively during deposition. The morphology and structural properties of the prepared thin films have been studied by AFM and XRD. The gas sensing properties of the SnO2 sensor to NO gas was evaluated by measuring electrical resistance between interdigitated electrodes. The highest sensitivity of the undoped SnO2 and Pd doped sensor was found to be around 9.5 and 42, respectively.


Sign in / Sign up

Export Citation Format

Share Document