Thermal mismatch stress development in Cu–ZrW2O8 composite investigated by synchrotron X-ray diffraction

2002 ◽  
Vol 62 (14) ◽  
pp. 1835-1839 ◽  
Author(s):  
S Yilmaz
2019 ◽  
Vol 248 ◽  
pp. 55-59 ◽  
Author(s):  
Sha Liu ◽  
Zhijie Wang ◽  
Jing Guo ◽  
Zhijun Shi ◽  
Xuejun Ren ◽  
...  

1997 ◽  
Vol 474 ◽  
Author(s):  
M. J. Nystrom ◽  
B. W. Wessels

ABSTRACTDomain stabilization in epitaxial potassium niobate films deposited by metalorganic chemical vapor deposition was studied. Stabilization was examined for films deposited on substrates with different coefficients of thermal expansion. X-ray diffraction of KNb03 films deposited on (100) MgAl204, (r) A1203, and (100)pseudocubic YAIO3 substrates shows a mixed domain structure consisting of (110) and (001) domains. However, KNb03 thin films deposited under identical conditions on (100) MgO, (100) SrTi03, and (100)pseudocubic LaA103 substrates exhibited only a single domain variant. A direct correlation between (001) domain volume fraction in the as-deposited KNb03 films and calculated strain resulting from thermal mismatch is observed.


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