Determination of crystal polarity from bend contours in transmission electron microscope images

2002 ◽  
Vol 92 (3-4) ◽  
pp. 111-132 ◽  
Author(s):  
E. Spiecker
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Transmission Electron ◽  
Microscope Images

scholarly journals Meso-Scale Transmission Electron Microscope Tomography Applied for Wax Distribution in Toner Particles

2013 ◽  
Vol 19 (S5) ◽  
pp. 58-61 ◽  
Author(s):  
Mino Yang ◽  
Jun-Ho Lee ◽  
Hee-Goo Kim ◽  
Euna Kim ◽  
Young-Nam Kwon ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Three Dimensional ◽  
Chromatic Aberration ◽  
Laser Printer ◽  
Medium Voltage ◽  
Transmission Electron ◽  
Z Contrast ◽  
Contrast Image

AbstractDistribution of wax in laser printer toner was observed using an ultra-high-voltage (UHV) and a medium-voltage transmission electron microscope (TEM). As the radius of the wax spans a hundred to greater than a thousand nanometers, its three-dimensional recognition via TEM requires large depth of focus (DOF) for a volumetric specimen. A tomogram with a series of the captured images would allow the determination of their spatial distribution. In this study, bright-field (BF) images acquired with UHV-TEM at a high tilt angle prevented the construction of the tomogram. Conversely, the Z-contrast images acquired by the medium-voltage TEM produced a successful tomogram. The spatial resolution for both is discussed, illustrating that the image degradation was primarily caused by beam divergence of the Z-contrast image and the combination of DOF and chromatic aberration of the BF image from the UHV-TEM.

Photoluminescence of 10H-SiC

2016 ◽  
Vol 858 ◽  
pp. 269-273
Author(s):  
Anne Henry ◽  
Hiroshi Yano ◽  
Tomoaki Hatayama
Keyword(s):  
Electron Microscope ◽  
Band Gap ◽  
Transmission Electron Microscope ◽  
Lower Energy ◽  
Free Exciton ◽  
Binding Energies ◽  
Photoluminescence Spectra ◽  
Transmission Electron ◽  
First Time

The photoluminescence of the near band gap emission of 10H-SiC is revealed for the first time and detected just below 3.0 eV. The crystallinity thus polytype of the sample is controlled with transmission electron microscope analyses and Laue diffraction. On the photoluminescence spectra up to eight sharp lines are associated to the non-phonon lines of the nitrogen bound exciton even if ten are expected in 10H-SiC. Phonon replicas of these non-phonon lines are observed at lower energy with energy separations similar than those in other hexagonal SiC polytypes. At moderate temperature free-exciton replicas are also observed which allow the determination of the excitonic band gap at 3020.6 meV, value in agreement with the hexagonality of 10H-SiC of 40%. The binding energies associated to the nitrogen bound-excitons are determined as well as the ionization energies of the nitrogen donors in the 10H-SiC polytype.

scholarly journals Simulation of Transmission Electron Microscope Images of Dislocations Pinned by Obstacles

2014 ◽  
Vol 55 (3) ◽  
pp. 413-417
Author(s):  
Yuhki Satoh ◽  
Takahiro Hatano ◽  
Nobuyasu Nita ◽  
Kimihiro Nogiwa ◽  
Hideki Matsui
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Transmission Electron ◽  
Microscope Images
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