Application of evanescent wave optics to the determination of absolute distance in surface force measurements using the atomic force microscope

2003 ◽  
Vol 94 (3-4) ◽  
pp. 283-291 ◽  
Author(s):  
S.T. Huntington ◽  
P.G. Hartley ◽  
J. Katsifolis
Keyword(s):  
Atomic Force Microscope ◽  
Evanescent Wave ◽  
Surface Force ◽  
Wave Optics ◽  
Absolute Distance ◽  
Force Measurements ◽  
Atomic Force

Heat Transfer Spectroscopy and “Heat Transfer-Distance” Curves

2008 ◽  
Author(s):  
Arvind Narayanaswamy ◽  
Sheng Shen ◽  
Gang Chen
Keyword(s):  
Heat Transfer ◽  
Radiative Transfer ◽  
Atomic Force Microscope ◽  
Near Field ◽  
Surface Force ◽  
Casimir Forces ◽  
Distance Curve ◽  
Transfer Distance ◽  
Atomic Force ◽  
Order Of Magnitude

Thermal radiative transfer between objects as well as near-field forces such as van der Waals or Casimir forces have their origins in the fluctuations of the electrodynamic field. Near-field radiative transfer between two objects can be enhanced by a few order of magnitude compared to the far-field radiative transfer that can be described by Planck’s theory of blackbody radiation and Kirchoff’s laws. Despite this common origin, experimental techniques of measuring near-field forces (using the surface force apparatus and the atomic force microscope) are more sophisticated than techniques of measuring near-field radiative transfer. In this work, we present an ultra-sensitive experimental technique of measuring near-field using a bi-material atomic force microscope cantilever as the thermal sensor. Just as measurements of near-field forces results in a “force distance curve”, measurement of near-field radiative transfer results in a “heat transfer-distance” curve. Results from the measurement of near-field radiative transfer will be presented.

Determination of performance on tunnel conduction through molecular wire using a conductive atomic force microscope

2001 ◽  
Vol 79 (22) ◽  
pp. 3708-3710 ◽  
Author(s):  
Hiroshi Sakaguchi ◽  
Atsushi Hirai ◽  
Futoshi Iwata ◽  
Akira Sasaki ◽  
Toshihiko Nagamura ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Molecular Wire ◽  
Atomic Force

Determination of the creep function using atomic force microscope

2020 ◽  
Vol 259 ◽  
pp. 126872
Author(s):  
Alexander P. Kren ◽  
Alexander S. Machikhin ◽  
Marat F. Bulatov
Keyword(s):  
Atomic Force Microscope ◽  
Creep Function ◽  
Atomic Force

CASIMIR FORCE EXPERIMENTS IN AIR: TWO BIRDS WITH ONE STONE

2010 ◽  
Vol 25 (11) ◽  
pp. 2231-2239 ◽  
Author(s):  
S. DE MAN ◽  
K. HEECK ◽  
K. SMITH ◽  
R. J. WIJNGAARDEN ◽  
D. IANNUZZI
Keyword(s):  
Atomic Force Microscope ◽  
High Precision ◽  
Electrostatic Potential ◽  
Casimir Force ◽  
Hydrodynamic Force ◽  
Force Sensor ◽  
Force Measurements ◽  
Atomic Force ◽  
Potential Measure ◽  
Interacting Surfaces

We present a short overview of the recent efforts of our group in the design of high precision Casimir force setups. We first describe our Atomic Force Microscope based technique that allows one to simultaneously and continuously calibrate the instrument, compensate for a residual electrostatic potential, measure the Casimir force, and, in the presence of a fluid in the gap between the interacting surfaces, measure the hydrodynamic force. Then we briefly discuss a new force sensor that adapts well to Casimir force measurements in critical environments.

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