Accurate multislice theory for elastic electron scattering in transmission electron microscopy

1997 ◽  
Vol 70 (1-2) ◽  
pp. 29-44 ◽  
Author(s):  
Jiang Hua Chen ◽  
Dirk Van Dyck
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Scattering ◽  
Elastic Electron ◽  
Elastic Electron Scattering ◽  
Transmission Electron

The use of an energy-filtering electron microscope to reduce chromatic aberration in images of thick biological specimens

1986 ◽  
Vol 44 ◽  
pp. 88-91
Author(s):  
L. D. Peachey ◽  
J. P. Heath ◽  
G. Lamprecht
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Beam ◽  
Cross Section ◽  
Electron Scattering ◽  
Chromatic Aberration ◽  
Image Resolution ◽  
Incident Electron Energy ◽  
Energy Filtering ◽  
Transmission Electron

Biological specimens of cells and tissues generally are considerably thicker than ideal for high resolution transmission electron microscopy. Actual image resolution achieved is limited by chromatic aberration in the image forming electron lenses combined with significant energy loss in the electron beam due to inelastic scattering in the specimen. Increased accelerating voltages (HVEM, IVEM) have been used to reduce the adverse effects of chromatic aberration by decreasing the electron scattering cross-section of the elements in the specimen and by increasing the incident electron energy.

Electron Scattering from Si Surface and Interface by Cross-Sectional Transmission Electron Microscopy

1994 ◽  
Vol 33 (Part 1, No. 11) ◽  
pp. 6406-6409
Author(s):  
Hiroshi Miyatake ◽  
Masahiro Yoneda ◽  
Keiichi Murayama ◽  
Jimpei Harada
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Scattering ◽  
Cross Sectional ◽  
Surface And Interface ◽  
Transmission Electron

scholarly journals Efficient first principles simulation of electron scattering factors for transmission electron microscopy

2019 ◽  
Vol 197 ◽  
pp. 16-22 ◽  
Author(s):  
Toma Susi ◽  
Jacob Madsen ◽  
Ursula Ludacka ◽  
Jens Jørgen Mortensen ◽  
Timothy J. Pennycook ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Scattering ◽  
First Principles ◽  
Transmission Electron

Precipitation of Kr In Ni at Room Temperature

1986 ◽  
Vol 74 ◽  
Author(s):  
R. C. Birtcher ◽  
A. S. Liu
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Diffraction ◽  
Electron Scattering ◽  
Room Temperature ◽  
Lattice Parameter ◽  
Dark Field ◽  
Asymptotic Limit ◽  
Transmission Electron ◽  
Fluence Dependence

AbstractThe fluence dependence of Kr precipitation in Ni at room temperature has been studied with the aid of Transmission Electron Microscopy. As in other metals, the Kr precipitates in small cavities. Electron diffraction demonstrates that the Kr precipitates are solid, fcc crystals aligned with each other and the Ni lattice. The trends are similar to those observed for Kr precipitation in Al at room temperature. The average Kr lattice parameter, determined from the electron diffraction, increases with increasing Kr fluence from 0.515 nm to an asymptotic value of 0.545 nm. The asymptotic limit is due to the melting of the larger Kr precipitates. The mismatch between the Kr and Ni lattices is as large as 55%. Diffuse electron scattering was observed from large, liquid Kr precipitaes. This occurs for Kr fluences above 5.1020 Kr+ m-2 in Ni and above 2.5.1020 Kr+ m-2 in Al. At room temperature, the largest solid Kr precipitate observed in dark field images was 8.3 nm in diameter compared to 4.7 nm in Al. The larger precipitates are liquid or gas. The solid Kr metals at the same lattice parameter in both Ni and Al suggesting that the melting is thermodynamic in nature and independent of the host material.

Scanning Transmission EM (STEM) of dynein ATPases

1987 ◽  
Vol 45 ◽  
pp. 798-799
Author(s):  
Kenneth A. Johnson ◽  
Silvio P. Marchese-Ragona ◽  
Joseph S. Wall
Keyword(s):  
Electron Microscopy ◽  
Molecular Weight ◽  
Transmission Electron Microscopy ◽  
Electron Scattering ◽  
Scanning Transmission Electron Microscopy ◽  
Mass Analysis ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Lines Of Evidence

The structure and molecular weight of the microtubule-dependent ATPase, dynein, was first established by scanning transmission electron microscopy (STEM) of dynein isolated from the cilia of Tetrahymena. It was shown that dynein consists of three globular heads joined to a common base by three slender, flexible strands. The globular heads have a diameter of 10-12 nm and the strands are 24 nm in length, such that the particles are 35 nm overall. Mass analysis by integration of electron scattering intensities in the STEM established a molecular weight of 1.9 million, with each head contributing 420,000. Several lines of evidence suggested that the base anchors the dynein to the A-tubule and the three independent, globular heads interact with the B-tubule of the adjacent outerdoublet in an ATP-dependent reaction to produce a force for sliding.

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