Microwave Fixation and Localization of Calcium in Synaptic Terminals Using X-Ray Microanalysis and Electron Energy Loss Spectroscopy Imaging

1997 ◽  
Vol 43 (1) ◽  
pp. 53-58 ◽  
Author(s):  
Vinci Mizuhira ◽  
Hiroshi Hasegawa
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
X Ray ◽  
Synaptic Terminals ◽  
Microwave Fixation ◽  
Electron Energy Loss

Signal/Noise Ratio and Elemental Detectivity by Eels

1982 ◽  
Vol 40 ◽  
pp. 488-489
Author(s):  
R. F. Egerton
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Elemental Analysis ◽  
Electron Energy Loss Spectroscopy ◽  
Emission Spectroscopy ◽  
X Ray ◽  
Signal Noise ◽  
Characteristic Signal ◽  
Noise Ratio ◽  
Electron Energy Loss

An important parameter governing the sensitivity and accuracy of elemental analysis by electron energy-loss spectroscopy (EELS) or by X-ray emission spectroscopy is the signal/noise ratio of the characteristic signal.

Determination of bonding in amorphous carbons by electron energy loss spectroscopy, Raman scattering and X-ray reflectivity

2000 ◽  
Vol 266-269 ◽  
pp. 765-768 ◽  
Author(s):  
A.C Ferrari ◽  
B Kleinsorge ◽  
G Adamopoulos ◽  
J Robertson ◽  
W.I Milne ◽  
...  
Keyword(s):  
Raman Scattering ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
X Ray ◽  
Electron Energy Loss
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