Sub-natural-width angle-resolved resonant Auger electron spectroscopy of atoms and molecules on the high resolution soft X-ray monochromator at SPring-8

Journal of Electron Spectroscopy and Related Phenomena ◽

10.1016/s0368-2048(00)00359-5 ◽

2001 ◽

Vol 114-116 ◽

pp. 63-68 ◽

Author(s):

Y. Shimizu ◽

H. Ohashi ◽

Y. Tamenori ◽

Y. Muramatsu ◽

H. Yoshida ◽

...

Keyword(s):

High Resolution ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Natural Width ◽

X Ray ◽

Atoms And Molecules

Download Full-text

Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser

10.3403/30124424 ◽

2005 ◽

Keyword(s):

Chemical Analysis ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Chemical ◽

X Ray ◽

Resolution Analysis ◽

Surface Chemical Analysis

Download Full-text

Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results

10.3403/30242215 ◽

2011 ◽

Keyword(s):

Chemical Analysis ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Chemical ◽

X Ray ◽

Surface Chemical Analysis

Download Full-text

Study of amorphous and crystallised Fe75B25 by Auger electron spectroscopy and X-ray photoelectron spectroscopy

Applied Surface Science ◽

10.1016/0169-4332(91)90396-2 ◽

1991 ◽

Vol 51 (3-4) ◽

pp. 139-155 ◽

Author(s):

S.K. Sharma ◽

S. Hofmann

Keyword(s):

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Download Full-text

X-ray photoemission and Auger electron spectroscopy analysis of fast responding activated metal oxide silicon carbide gas sensors

Thin Solid Films ◽

10.1016/s0040-6090(96)09407-2 ◽

1997 ◽

Vol 299 (1-2) ◽

pp. 183-189 ◽

Author(s):

A Lloyd Spetz ◽

D Schmeißer ◽

A Baranzahi ◽

B Wälivaara ◽

W Göpel ◽

...

Keyword(s):

Silicon Carbide ◽

Metal Oxide ◽

Auger Electron Spectroscopy ◽

Gas Sensors ◽

Electron Spectroscopy ◽

Auger Electron ◽

Spectroscopy Analysis ◽

Auger Electron Spectroscopy Analysis ◽

X Ray ◽

Metal Oxide Silicon

Download Full-text

High resolution Auger electron spectroscopy studies on (100) and (111) facets of chemical vapor deposited diamond

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.581039 ◽

1998 ◽

Vol 16 (2) ◽

pp. 413-418 ◽

Author(s):

T. Sharda ◽

D. S. Misra ◽

E. W. Seibt ◽

P. Selvam

Keyword(s):

High Resolution ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Chemical Vapor ◽

Chemical Vapor Deposited ◽

Spectroscopy Studies

Download Full-text

International Standardization of Quantitative Surface Analysis by Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy

Shinku ◽

10.3131/jvsj.48.261 ◽

2005 ◽

Vol 48 (4) ◽

pp. 261-264

Author(s):

Shigeo TANUMA

Keyword(s):

Auger Electron Spectroscopy ◽

Surface Analysis ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray ◽

Quantitative Surface Analysis ◽

International Standardization

Download Full-text

Summary of ISO/TC 201 Standard: XXIX. ISO 20903: 2006—Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—methods used to determine peak intensities and information required when reporting results

Surface and Interface Analysis ◽

10.1002/sia.2533 ◽

2007 ◽

Vol 39 (5) ◽

pp. 464-466 ◽

Author(s):

C. J. Powell

Keyword(s):

Chemical Analysis ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Chemical ◽

X Ray ◽

Surface Chemical Analysis

Download Full-text

A correlation of Auger electron spectroscopy, x‐ray photoelectron spectroscopy, and Rutherford backscattering spectrometry measurements on sputter‐deposited titanium nitride thin films

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.574092 ◽

1986 ◽

Vol 4 (6) ◽

pp. 2463-2469 ◽

Author(s):

Brad J. Burrow ◽

Alan E. Morgan ◽

Russell C. Ellwanger

Keyword(s):

Titanium Nitride ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Rutherford Backscattering Spectrometry ◽

Rutherford Backscattering ◽

X Ray ◽

Sputter Deposited

Download Full-text

Apparatus for High Resolution Positron Annihilation Induced Auger Electron Spectroscopy

Materials Science Forum ◽

10.4028/www.scientific.net/msf.175-178.255 ◽

1994 ◽

Vol 175-178 ◽

pp. 255-260

Author(s):

H.Q. Zhou ◽

S. Yang ◽

E.S. Jung ◽

Alex H. Weiss

Keyword(s):

High Resolution ◽

Auger Electron Spectroscopy ◽

Positron Annihilation ◽

Electron Spectroscopy ◽

Download Full-text

Initial adsorption kinetics of oxygen on a Cu0.82Li0.18 alloy surface studied by combined Auger electron spectroscopy, x‐ray photoelectron spectroscopy, and time‐of‐flight spectrometry of direct recoils

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.574817 ◽

1987 ◽

Vol 5 (4) ◽

pp. 1136-1141 ◽

Author(s):

M. H. Mintz ◽

U. Atzmony ◽

J. A. Schultz ◽

N. Shamir

Keyword(s):

Auger Electron Spectroscopy ◽

Adsorption Kinetics ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Time Of Flight ◽

Alloy Surface ◽

X Ray ◽

Initial Adsorption ◽

Download Full-text