Simulation of fibre suspension flows by the Brownian configuration field method

1999 ◽  
Vol 84 (2-3) ◽  
pp. 257-274 ◽  
Author(s):  
X.-J. Fan ◽  
N. Phan-Thien ◽  
R. Zheng
2011 ◽  
Vol 23 (4) ◽  
pp. 211-217 ◽  
Author(s):  
Jari Hämäläinen ◽  
Roope Eskola ◽  
Anna-Leena Erkkilä ◽  
Teemu Leppänen

2020 ◽  
Vol 200 ◽  
pp. 284-297
Author(s):  
Ali Faghani ◽  
Samya Sen ◽  
Mahdi Vaezi ◽  
Amit Kumar

2000 ◽  
Vol 92 (2-3) ◽  
pp. 135-150 ◽  
Author(s):  
J.M.W. Munganga ◽  
B.D. Reddy ◽  
K.J. Diatezua

Author(s):  
Douglas C. Barker

A number of satisfactory methods are available for the electron microscopy of nicleic acids. These methods concentrated on fragments of nuclear, viral and mitochondrial DNA less than 50 megadaltons, on denaturation and heteroduplex mapping (Davies et al 1971) or on the interaction between proteins and DNA (Brack and Delain 1975). Less attention has been paid to the experimental criteria necessary for spreading and visualisation by dark field electron microscopy of large intact issociations of DNA. This communication will report on those criteria in relation to the ultrastructure of the (approx. 1 x 10-14g) DNA component of the kinetoplast from Trypanosomes. An extraction method has been developed to eliminate native endonucleases and nuclear contamination and to isolate the kinetoplast DNA (KDNA) as a compact network of high molecular weight. In collaboration with Dr. Ch. Brack (Basel [nstitute of Immunology), we studied the conditions necessary to prepare this KDNA Tor dark field electron microscopy using the microdrop spreading technique.


Author(s):  
J. M. Oblak ◽  
B. H. Kear

The “weak-beam” and systematic many-beam techniques are the currently available methods for resolution of closely spaced dislocations or other inhomogeneities imaged through strain contrast. The former is a dark field technique and image intensities are usually very weak. The latter is a bright field technique, but generally use of a high voltage instrument is required. In what follows a bright field method for obtaining enhanced resolution of partial dislocations at 100 KV accelerating potential will be described.A brief discussion of an application will first be given. A study of intermediate temperature creep processes in commercial nickel-base alloys strengthened by the Ll2 Ni3 Al γ precipitate has suggested that partial dislocations such as those labelled 1 and 2 in Fig. 1(a) are in reality composed of two closely spaced a/6 <112> Shockley partials. Stacking fault contrast, when present, tends to obscure resolution of the partials; thus, conditions for resolution must be chosen such that the phase shift at the fault is 0 or a multiple of 2π.


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