Structural characterization of InGaN thin films and multiple quantum wells: an approach of combining various X-ray scattering methods
2003 ◽
Vol 336
(1-2)
◽
pp. 109-117
◽
Keyword(s):
X Ray
◽
2012 ◽
Vol 544
◽
pp. 34-38
◽
2005 ◽
Vol 22
(10)
◽
pp. 2700-2703
◽
Keyword(s):
2004 ◽
Vol 320
(1)
◽
pp. 176-182
◽