The use of atomic force microscopy to quantify membrane surface electrical properties

2002 ◽  
Vol 201 (1-3) ◽  
pp. 73-83 ◽  
Author(s):  
W.Richard Bowen ◽  
Teodora A Doneva ◽  
J.Austin G Stoton
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Properties ◽  
Membrane Surface ◽  
Force Microscopy ◽  
Atomic Force

Mechanical Properties of Membrane Surface of Cultured Astrocyte Revealed by Atomic Force Microscopy

2000 ◽  
Vol 39 (Part 1, No. 6B) ◽  
pp. 3711-3716 ◽  
Author(s):  
Hatsuki Shiga ◽  
Yukako Yamane ◽  
Etsuro Ito ◽  
Kazuhiro Abe ◽  
Kazushige Kawabata ◽  
...  
Keyword(s):  
Mechanical Properties ◽  
Atomic Force Microscopy ◽  
Membrane Surface ◽  
Force Microscopy ◽  
Atomic Force

Image enhancement of polyethersulfone ultrafiltration membrane surface structure for atomic force microscopy

1992 ◽  
Vol 46 (1) ◽  
pp. 167-178 ◽  
Author(s):  
A. K. Fritzsche ◽  
A. R. Arevalo ◽  
M. D. Moore ◽  
C. J. Weber ◽  
V. B. Elings ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Structure ◽  
Image Enhancement ◽  
Membrane Surface ◽  
Ultrafiltration Membrane ◽  
Force Microscopy ◽  
Atomic Force

Characterization of the Electrical Properties of Nickel-Based CMSX-4 Super-alloys Using Atomic Force Microscopy (AFM)

2004 ◽  
Vol 10 (S02) ◽  
pp. 1102-1103
Author(s):  
Guangchun Cui ◽  
Rosario A Gerhardt
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Properties ◽  
Force Microscopy ◽  
Atomic Force

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Nanoscale surface electrical properties of zinc oxide films investigated by conducting atomic force microscopy

2007 ◽  
Vol 71 (1) ◽  
pp. 1-4 ◽  
Author(s):  
Chang-Feng Yu ◽  
Sy-Hann Chen ◽  
Wen-Jia Xie ◽  
Yung-Shao Lin ◽  
Cheng-Yu Shen ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Zinc Oxide ◽  
Electrical Properties ◽  
Oxide Films ◽  
Force Microscopy ◽  
Zinc Oxide Films ◽  
Atomic Force

scholarly journals Electrical conductivity of silver nanoparticle doped carbon nanofibres measured by CS-AFM

RSC Advances ◽  
2019 ◽  
Vol 9 (8) ◽  
pp. 4553-4562 ◽  
Author(s):  
Wael Ali ◽  
Valbone Shabani ◽  
Matthias Linke ◽  
Sezin Sayin ◽  
Beate Gebert ◽  
...  
Keyword(s):  
Electrical Conductivity ◽  
Atomic Force Microscopy ◽  
Electrical Properties ◽  
Silver Nanoparticle ◽  
Carbon Nanofibres ◽  
Force Microscopy ◽  
Atomic Force ◽  
Composite Carbon

In this work, a pioneering study on the electrical properties of composite carbon nanofibres (CNFs) using current-sensitive atomic force microscopy (CS-AFM) has been demonstrated.

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