A temperature-dependent pre-exponential factor in Efros–Shklovskii variable range hopping conduction in p-type CuInTe2

2003 ◽  
Vol 18 (1-3) ◽  
pp. 292-293 ◽  
Author(s):  
C. Quiroga ◽  
R. Oentrich ◽  
I. Bonalde ◽  
E. Medina D. ◽  
S.M. Wasim ◽  
...  
2017 ◽  
Vol 107 ◽  
pp. 285-292 ◽  
Author(s):  
S.M. Wasim ◽  
L. Essaleh ◽  
G. Marín ◽  
C. Rincón ◽  
S. Amhil ◽  
...  

2017 ◽  
Vol 122 (1) ◽  
pp. 015702 ◽  
Author(s):  
L. Essaleh ◽  
S. M. Wasim ◽  
G. Marín ◽  
C. Rincón ◽  
S. Amhil ◽  
...  

2000 ◽  
Vol 219 (2) ◽  
pp. 351-356 ◽  
Author(s):  
M. Iqbal ◽  
J. Galibert ◽  
S.M. Wasim ◽  
E. Hernandez ◽  
P. Bocaranda ◽  
...  

2015 ◽  
Vol 1770 ◽  
pp. 25-30 ◽  
Author(s):  
V.C. Lopes ◽  
A.J. Syllaios ◽  
D. Whitfield ◽  
K. Shrestha ◽  
C.L. Littler

ABSTRACTWe report on electrical conductivity and noise measurements made on p-type hydrogenated amorphous silicon (a-Si:H) thin films prepared by Plasma Enhanced Chemical Vapor Deposition (PECVD). The temperature dependent electrical conductivity can be described by the Mott Variable Range Hopping mechanism. The noise at temperatures lower than ∼ 400K is dominated by a 1/f component which follows the Hooge model and correlates with the Mott conductivity. At high temperatures there is an appreciable G-R noise component.


2019 ◽  
Vol 58 (9) ◽  
pp. 098004 ◽  
Author(s):  
Hideharu Matsuura ◽  
Akinobu Takeshita ◽  
Tatsuya Imamura ◽  
Kota Takano ◽  
Kazuya Okuda ◽  
...  

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