Microstructural Characterization and Growth Kinetics of the Reaction Layer in U-10wt% Zr/Zircaloy-4 Diffusion Couples

2018 ◽  
Vol 47 (9) ◽  
pp. 2675-2681
Author(s):  
Zhang Yuting ◽  
Wang Xin ◽  
Liu Pengchuang ◽  
Zeng Gang ◽  
Pang Xiaoxuan ◽  
...  
1986 ◽  
Vol 71 ◽  
Author(s):  
L. R. Zheng ◽  
L. R. Doolittle ◽  
J. W. Mayer

AbstractSilicide formation and growth are studied in three geometries: conventional planar thin films, lateral diffusion couples formed by depositing metal layers on Si islands, and device geometry couples formed by depositing metal on oxide-patterned Si substrates. The influence of impurities is studied by implanting arsenic and krypton into conventional and device geometry structures.Here we present growth kinetics of CrSi2 where the presence of impurities has a strong influence. Si transport dominates in disilicide formation and leads to erosion of contacts around the periphery of oxide windows. Implantation of arsenic suppresses CrSi 2 formation; with krypton implantation, the growth kinetics shifts from linear to square-root in character. We attribute these results to impurity segregation at interfaces or grain boundaries.


2009 ◽  
Vol 24 (5) ◽  
pp. 787-790 ◽  
Author(s):  
Xiao Ren ◽  
Guoqing Chen ◽  
Wenlong Zhou ◽  
Chengwei Wu ◽  
Junshan Zhang

1995 ◽  
Vol 152 (2) ◽  
pp. 385-392 ◽  
Author(s):  
V. H. Garcia ◽  
C. Scherer ◽  
P. M. Mors

Author(s):  
C. Cserháti ◽  
Gy. Glodán ◽  
A. Csik ◽  
G.A. Langer ◽  
Z. Erdélyi ◽  
...  

2004 ◽  
Vol 11 (03) ◽  
pp. 337-340 ◽  
Author(s):  
E. B. HANNECH ◽  
N. LAMOUDI ◽  
A. GASMI

The growth kinetics of the solid solution phase of aluminum in copper in diffusion couples of pure aluminum and copper has been investigated at 425°C using a scanning electron microscope. In the initial stage, the phase layer growth was found to obey the parabolic law, indicating that the rate-controlling process is diffusion. At longer times, the growth rate deviates from the kt-1/2 behavior of the early stage.


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