scholarly journals A new spatial angle assembly method of the ICF target

Author(s):  
Wenrong Wu ◽  
Lie Bi ◽  
Kai Du ◽  
Juan Zhang ◽  
Honggang Yang ◽  
...  

The designs of inertial confinement fusion (ICF) targets, which field on ShenGuang III, are becoming more complex and more stringent in terms of assembly precision. A key specification of these targets is the spatial angle alignment accuracy. To meet these needs, we present a new spatial angle assembly method, using target part’s 3D model-based dual orthogonal camera vision, which is better suited for the flexible automation of target assembly processes. The two-hands structure micromanipulate system and dual orthogonal structure visual feedback system were investigated by considering the kinematics, spatial angle measuring, and motion control in an integrated way. In this paper, we discuss the measurement accuracy of spatial angle assembly method, which compared the real-time image acquisition with the redrawing 2D projection. The result shows that the assembly method proposed is very effective and meets the requirements of angle assembly accuracy, which is less than $1^{\circ }$. Also, this work is expected to contribute greatly to the advancement of other target microassembly equipments.

Author(s):  
C. W. Price ◽  
E. F. Lindsey

Thickness measurements of thin films are performed by both energy-dispersive x-ray spectroscopy (EDS) and x-ray fluorescence (XRF). XRF can measure thicker films than EDS, and XRF measurements also have somewhat greater precision than EDS measurements. However, small components with curved or irregular shapes that are used for various applications in the the Inertial Confinement Fusion program at LLNL present geometrical problems that are not conducive to XRF analyses but may have only a minimal effect on EDS analyses. This work describes the development of an EDS technique to measure the thickness of electroless nickel deposits on gold substrates. Although elaborate correction techniques have been developed for thin-film measurements by x-ray analysis, the thickness of electroless nickel films can be dependent on the plating bath used. Therefore, standard calibration curves were established by correlating EDS data with thickness measurements that were obtained by contact profilometry.


2020 ◽  
Vol 36 ◽  
pp. 100749 ◽  
Author(s):  
R.E. Olson ◽  
R.J. Leeper ◽  
S.H. Batha ◽  
R.R. Peterson ◽  
P.A. Bradley ◽  
...  

2021 ◽  
Vol 28 (3) ◽  
pp. 032713
Author(s):  
Dongguo Kang ◽  
Huasen Zhang ◽  
Shiyang Zou ◽  
Wudi Zheng ◽  
Shaoping Zhu ◽  
...  

2021 ◽  
Vol 92 (7) ◽  
pp. 073505
Author(s):  
T. J. Awe ◽  
L. Perea ◽  
J. C. Hanson ◽  
A. J. York ◽  
D. W. Johnson ◽  
...  

2021 ◽  
Vol 141 ◽  
pp. 107158
Author(s):  
Jiamei Li ◽  
Dawei Li ◽  
Hui Yu ◽  
Fengnian Lv ◽  
Qiong Zhou ◽  
...  

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