A Technique For The Rapid Determination of the Contrast Transfer Characteristics of an Electron Microscope
1973 ◽
Vol 31
◽
pp. 278-279
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Keyword(s):
A focal series of a thin carbon film in bright-field phase contrast has been used by Thon to obtain a family of curves that represent the contrast transfer characteristics of a particular objective lens as a function of the defocus value. The thin carbon film is assumed to be a weak phase object, and the light optical diffractogram gives the Fourier transform of each micrograph from which the relative contrast at each spatial frequency can be obtained for the corresponding amount of defocus.We have obtained the equivalent information from a single electron micrograph of a thin carbon film specimen tilted at a large angle (65°), see Fig. 1.
1978 ◽
Vol 36
(1)
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pp. 72-73
1981 ◽
Vol 39
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pp. 434-435
Keyword(s):
1993 ◽
Vol 51
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pp. 1028-1029
Keyword(s):
1997 ◽
Vol 226
(3-4)
◽
pp. 212-216
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Keyword(s):
1999 ◽
Vol 146
(9)
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pp. 3264-3269
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Keyword(s):
Keyword(s):
1974 ◽
Vol 32
◽
pp. 560-561
Keyword(s):
1977 ◽
Vol 35
◽
pp. 82-83
Keyword(s):
1975 ◽
Vol 33
◽
pp. 224-225
Keyword(s):
1978 ◽
Vol 36
(1)
◽
pp. 174-175