Electron diffraction contrast of fluxons
Partial penetration of an applied external magnetic field occurs in type-II superconductors. The properties of magnetic fluxons are important in determining the critical current density of type-II superconductors as it is the mobility of the fluxon lattice that limits the high value of critical current density of superconductors. There have been various experimental techniques in use to study the fluxons, e.g. the decoration technique, neutron diffraction, electron holography and scanning tunneling microscopy.Noting that in the thin crystal case the magnetic fluxes have a tangential component which deflects incident electrons, we explore the possibility of using conventional electron diffraction contrast technique to observe the fluxons. This is accomplished by using the London model for the vortex in thin crystals and the classical electromagnetic theory based on Maxwell equations to construct the magnetic field of a fluxon.