Σ =13 tilt grain boundary in silicon bicrystal

Author(s):  
M.J. Kim ◽  
Y.L. Chen ◽  
R.W. Carpenter ◽  
J.C. Barry ◽  
G.H. Schwuttke

The structure of grain boundaries (GBs) in metals, semiconductors and ceramics is of considerable interest because of their influence on physical properties. Progress in understanding the structure of grain boundaries at the atomic level has been made by high resolution electron microscopy (HREM) . In the present study, a Σ=13, (510) <001>-tilt grain boundary in silicon was characterized by HREM in conjunction with digital image processing and computer image simulation techniques.The bicrystals were grown from the melt by the Czochralski method, using preoriented seeds. Specimens for TEM observations were cut from the bicrystals perpendicular to the common rotation axis of pure tilt grain boundary, and were mechanically dimpled and then ion-milled to electron transparency. The degree of misorientation between the common <001> axis of the bicrystal was measured by CBED in a Philips EM 400ST/FEG: it was found to be less than 1 mrad. HREM was performed at 200 kV in an ISI-002B and at 400 kv in a JEM-4000EX.

Author(s):  
Richard W. Fonda ◽  
David E. Luzzi

The atomic structure of the Σ=5 [001] (310) grain boundary in NiAl was examined by high resolution electron microscopy and multislice image simulation. As in most other intermetallic compounds, the grain boundaries in NiAl are intrinsically brittle at low temperatures. Although there have been few studies on this alloy, the energies of NiAl grain boundaries have been calculated using embedded atom potentials for both stoichiometric and non-stoichiometric structures. These studies are consistent with the results of Bradley and Taylor, which indicate that nickel-rich compositions result from nickel antisite defects on the aluminum sublattice, while aluminum-rich compositions produce constitutional vacancies on the nickel sublattice, and with recent field ion microscopy results on nickel-rich alloys.The Σ=5 grain boundary was prepared by diffusion bonding at 1000 °C. A JEOL 4000EX was used for HREM imaging and the NUMIS multislice simulation program was used to simulated images. Analysis of these images considered the effects of grain boundary expansion, rigid body displacements along the boundary, grain boundary stoichiometry, and point defects at the boundary.


Author(s):  
Jean-Luc Rouvière ◽  
Alain Bourret

The possible structural transformations during the sample preparations and the sample observations are important issues in electron microscopy. Several publications of High Resolution Electron Microscopy (HREM) have reported that structural transformations and evaporation of the thin parts of a specimen could happen in the microscope. Diffusion and preferential etchings could also occur during the sample preparation.Here we report a structural transformation of a germanium Σ=13 (510) [001] tilt grain boundary that occurred in a medium-voltage electron microscopy (JEOL 400KV).Among the different (001) tilt grain boundaries whose atomic structures were entirely determined by High Resolution Electron Microscopy (Σ = 5(310), Σ = 13 (320), Σ = 13 (510), Σ = 65 (1130), Σ = 25 (710) and Σ = 41 (910), the Σ = 13 (510) interface is the most interesting. It exhibits two kinds of structures. One of them, the M-structure, has tetracoordinated covalent bonds and is periodic (fig. 1). The other, the U-structure, is also tetracoordinated but is not strictly periodic (fig. 2). It is composed of a periodically repeated constant part that separates variable cores where some atoms can have several stable positions. The M-structure has a mirror glide symmetry. At Scherzer defocus, its HREM images have characteristic groups of three big white dots that are distributed on alternatively facing right and left arcs (fig. 1). The (001) projection of the U-structure has an apparent mirror symmetry, the portions of good coincidence zones (“perfect crystal structure”) regularly separate the variable cores regions (fig. 2).


Author(s):  
Stuart McKernan ◽  
C. Barry Carter

General tilt grain boundaries can be viewed in terms of small structural units of varying complexity. High-resolution electron microscope (HREM) images of these boundaries in many materials show this repetitive similarity of the atomic structure at the boundary plane. The structure of particular grain boundaries has been examined for several special cases and commonly observed configurations include symmetric tilt grain boundaries and asymmetric tilt grain boundaries with one grain having a prominent, low-index facet. Several different configurations of the boundary structure may possibly occur, even in the same grain boundary. There are thus many possible ways to assemble the basic structural units to form a grain boundary. These structural units and their distribution have traditionally been examined by high-resolution electron microscopy. The images of the projection of the atomic columns (or the tunnels between atomic columns) providing a template for constructing “ball-and-stick ” models of the interface.


1999 ◽  
Vol 589 ◽  
Author(s):  
V. Potin ◽  
G. Nouet ◽  
P. Ruterana ◽  
R.C. Pond

AbstractThe studied GaN layers are made of mosaYc grains rotated around the c-axis by angles in the range 0-25°. Using high-resolution electron microscopy, anisotropic elasticity calculations and image simulation, we have analyzed the atomic structure of the edge threading dislocations. Here, we present an analysis of the Σ = 7 boundary using circuit mapping in order to define the Burgers vectors of the primary and secondary dislocations. The atomic structure of the primary ones was found to exhibit 5/7 and 8 atom cycles.


1991 ◽  
Vol 238 ◽  
Author(s):  
Elsie C. Urdaneta ◽  
David E. Luzzi ◽  
Charles J. McMahon

ABSTRACTBismuth-induced grain boundary faceting in Cu-12 at ppm Bi polycrystals was studied using transmission electron microscopy (TEM). The population of faceted grain boundaries in samples aged at 600°C was observed to increase with heat treatment time from 15min to 24h; aging for 72h resulted in de-faceting, presumably due to loss of Bi from the specimen. The majority of completely faceted boundaries were found between grains with misorientation Σ=3. About 65% of the facets of these boundaries were found to lie parallel to crystal plane pairs of the type {111}1/{111]2- The significance of these findings in light of recent high resolution electron microscopy experiments is discussed.


2007 ◽  
Vol 558-559 ◽  
pp. 979-982 ◽  
Author(s):  
E. Tochigi ◽  
A. Nakamura ◽  
Naoya Shibata ◽  
Takahisa Yamamoto ◽  
K.P.D. Lagerlöf ◽  
...  

Dislocation structure of 10º low-angle tilt grain boundary in α-Al2O3 has been observed by high-resolution electron microscopy (HRTEM). It was found that perfect <1120> edge dislocations, which are introduced to compensate the misorientation, dissociated into two mixed partial dislocations with {1120} stacking-fault in between. The distances between the two partials were estimated by the force balances between repulsive forces of periodical dislocations and attractive forces from stacking-fault. The stacking-fault energy for 10o low-angle tilt grain boundary was estimated to be much higher than the previously reported value.


1996 ◽  
Vol 466 ◽  
Author(s):  
M. Shamsuzzoha ◽  
P. A. Deymier ◽  
David J. Smith

ABSTRACTA 66° [110] asymmetric tilt grain boundary in Al prepared by cold rolling and annealing has been studied by high-resolution electron microscopy. Due to a 4.5° deviation from the perfect Σ3 misorientation, the boundary is heavily faceted with straight segments running parallel to (111) and (112) planes. All atomic sites across the (111) facets appear to be coincident with the (111) planes at an angle of 66°. The line defects which accommodate the deviation from the perfect twin orientation result in grain boundary stepping. The observed structural features can be described in terms of secondary grain boundary dislocations with Burgers vectors of the type ⅓<111>, and ⅙<112> as well as their interactions.


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