Images and Applications of Ion Explosion Spike Pits

Author(s):  
P. Fraundorf ◽  
J. Tentschert

Since the discovery of their etchability in the early 1960‘s, nuclear particle tracks in insulators have had a diverse and exciting history of application to problems ranging from the selective filtration of cancer cells from blood to the detection of 244Pu in the early solar system. Their usefulness stems from the fact that they are comprised of a very thin (e.g. 20-40Å) damage core which etches more rapidly than does the bulk material. In fact, because in many insulators tracks are subject to radiolysis damage (beam annealing) in the transmission electron microscope, the body of knowledge concerning etched tracks far outweighs that associated with latent (unetched) tracks in the transmission electron microscope.With the development of scanned probe microscopies with lateral resolutions on the near atomic scale, a closer look at the structure of unetched nuclear particle tracks, particularly at their point of interface with solid surfaces, is now warranted and we think possible. The ion explosion spike model of track formation, described loosely, suggests that a burst of ionization along the path of a charged particle in an insulator creates an electrostatically unstable array of adjacent ions which eject one another by Coulomb repulsion from substitutional into interstitial sites. Regardless of the mechanism, the ejection process which acts to displace atoms along the track core seems likely to operate at track entry and exit surfaces, with the added feature of mass loss at those surfaces as well. In other words, we predict pits whose size is comparable to the track core width.

1998 ◽  
Vol 4 (S2) ◽  
pp. 856-857
Author(s):  
David M. Longo ◽  
James M. Howe ◽  
William C. Johnson

The focused ion beam (FIB) has become an indispensable tool for a variety of applications in materials science, including that of specimen preparation for the transmission electron microscope (TEM). Several FIB specimen preparation techniques have been developed, but some problems result when FIB specimens are analyzed in the TEM. One of these is X-ray fluorescence from bulk material surrounding the thin membrane in FIB-prepared samples. This paper reports on a new FIB specimen preparation method which was devised for the reduction of X-ray fluorescence during energy dispersive X-ray spectroscopy (EDS) in the TEM.Figure 1 shows three membrane geometries that were investigated in this study on a single-crystal Si substrate with a RF sputter-deposited 50 nm Ni film. Membrane 1 is the most commonly reported geometry in the literature, with an approximately 20 urn wide trench and a membrane having a single wedge with a 1.5° incline.


1989 ◽  
Vol 157 ◽  
Author(s):  
Tim J. Bullough ◽  
C. J. Humphreys ◽  
R. W. Devenish

ABSTRACTA wide variety of materials which are normally undamaged when exposed to a lOOkeV electron beam in a conventional transmission electron microscope can be modified on a nanometre scale by the high current density electron probe in a dedicated scanning transmission electron microscope (STEM). A stationary 100keV STEM electron probe can produce holes typically l-5nm diameter through crystalline Al, Si and MgO tens of nanometres in thickness, while a scanned electron beam can smooth surfaces on an atomic scale.In Al the stationary electron probe in the STEM produces a row of facetted voids along the irradiated volume. The voids grow initially inwards from the electron exit surface, with each void typically 4nm in diameter and 12-24nm in length, separated by equal distances from one another. In contrast, continuous holes 1.2-1.6nm diameter form at the electron exit surface of Si when exposed to the focused electron beam. However, these holes form only at specific randomly distributed points separated from one another by 2-4nm over the surface of crystalline specimens of both n- and p-doped <001> and <111> Si.Square cross-section holes with widths of about lnm can be formed by the stationary electron probe in MgO crystals. Rastering the probe over a restricted area of MgO initially results in the rapid development of surface islands and channels which are subsequently removed to leave an atomically smooth surface.


Author(s):  
R. D. Specian ◽  
V. F. Allison ◽  
J. E. Ubelaker

Although the scolex is the major area of contact between a cestode and its host, most fine structural studies have concentrated on the rest of the body. Davey and Breckenridge postulated, from histochemical data, that neurosecretory cells were present in the scolex of Hymenolepis diminuta. Such cells have been suggested to function in affecting growth and maturation of the strobila. Since a previous study by Rothman failed to determine such cells, the present study was undertaken.Specimens were collected from previously infected laboratory rats, fixed in paraformaldehyde, post-fixed in osmium tetroxide and embedded in Maraglas. Sections were examined on the Hitachi HU11B-2 transmission electron microscope.


2020 ◽  
Vol 20 (12) ◽  
pp. 7743-7747
Author(s):  
Yan-Hui Chen ◽  
Xue-Qiao Li ◽  
Qing-Song Deng ◽  
Ang Li

A thin, clean pristine Au film created in a transmission electron microscope chamber was tailored by an electron beam. Various kinds of nanopatterns, including hexagonal holes and dumbbell-like patterns, were fabricated by different doses of the electron beam. A high-quality series of in situ images were recorded to explore the irradiation mechanism. The electron-matter collision enabled the electron beam to act as a tweezer to arrange atoms into a specified pattern.


Sign in / Sign up

Export Citation Format

Share Document