Predicting the accuracy of mineral phase analysis by X-ray diffraction using Monte Carlo modelling

Rapid, on-line measurement of feedstock mineralogy is a highly attractive technology for the mineral processing industry. A Monte Carlo particle transport-based modelling technique has been developed to help design and predict the measurement performance of on-line energy-dispersive X-ray diffraction (EDXRD) analysers. The accuracy of the technique was evaluated by performing quantitative phase analysis on a suite of fifteen synthetic potash ore samples. The diffraction profile of each sample was measured with a laboratory EDXRD analyser and an equivalent profile was simulated in the Monte Carlo package. Linear regression analysis was used to determine the mineral abundances in each sample from both the measured and modelled profiles. Comparison of the results showed that the diffraction profiles and measurement accuracies obtained by simulation agree very well with the measured data.

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On-line X-ray diffraction for quantitative phase analysis: an industrial application of the Rietveld method

Acta Crystallographica Section A Foundations of Crystallography ◽

10.1107/s0108767302094710 ◽

2002 ◽

Vol 58 (s1) ◽

pp. c243-c243

Author(s):

N. V. Y. Scarlett ◽

I. C. Madsen ◽

P. Storer

Keyword(s):

Phase Analysis ◽

Industrial Application ◽

Rietveld Method ◽

Quantitative Phase Analysis ◽

X Ray Diffraction ◽

X Ray ◽

Quantitative Phase ◽

On Line

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X-Ray Diffraction Intensity of Oxide Solid Solutions: Application to Qualitative and Quantitative Phase Analysis

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-3727-0_16 ◽

1982 ◽

pp. 119-128

Author(s):

Ronald C. Gehringer ◽

Gregory J. McCarthy ◽

R. G. Garvey ◽

Deane K. Smith

Keyword(s):

Phase Analysis ◽

Solid Solutions ◽

Quantitative Phase Analysis ◽

X Ray Diffraction ◽

Diffraction Intensity ◽

X Ray ◽

Quantitative Phase ◽

Qualitative And Quantitative

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Quantitative Phase Analysis in Textured Steels by Continuous X-ray Diffraction Method with Energy Analysis System

Tetsu-to-Hagane ◽

10.2355/tetsutohagane1955.67.11_2039 ◽

1981 ◽

Vol 67 (11) ◽

pp. 2039-2048 ◽

Cited By ~ 3

Author(s):

Nobukatsu FUJINO ◽

Yoshiro MATSUMOTO ◽

Yasuhiro MAEHARA

Keyword(s):

Phase Analysis ◽

Energy Analysis ◽

Diffraction Method ◽

Quantitative Phase Analysis ◽

X Ray Diffraction ◽

X Ray ◽

Quantitative Phase ◽

Analysis System

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A Monte Carlo error simulation applied to calibration-free X-ray diffraction phase analysis

Journal of Applied Crystallography ◽

10.1107/s0021889886089549 ◽

1986 ◽

Vol 19 (4) ◽

pp. 217-221 ◽

Cited By ~ 2

Author(s):

G. E. Braun

Keyword(s):

Monte Carlo ◽

Phase Analysis ◽

X Ray Diffraction ◽

X Ray ◽

Calibration Free ◽

Error Simulation

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Quantitative Phase Analysis by X-Ray Diffraction.

Analytical Chemistry ◽

10.1021/ac60244a026 ◽

1966 ◽

Vol 38 (12) ◽

pp. 1741-1745 ◽

Cited By ~ 25

Author(s):

R. F. Karlak ◽

D. S. Burnett

Keyword(s):

Phase Analysis ◽

Quantitative Phase Analysis ◽

X Ray Diffraction ◽

X Ray ◽

Quantitative Phase

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Quantitative Phase Analysis in Titanium by X-Ray Diffraction

Advances in X-ray Analysis ◽

10.1154/s0376030800000070 ◽

1957 ◽

Vol 1 ◽

pp. 39-58

Author(s):

Ralph H. Hiltz ◽

Stanley L. Lopata

Keyword(s):

Phase Analysis ◽

Quantitative Phase Analysis ◽

Metallographic Analysis ◽

X Ray Diffraction ◽

X Ray ◽

Quantitative Phase ◽

Method Of Measurement ◽

Graphic Methods

AbstractIn view of present difficulties encountered in met alio graphic methods of phase analysis of titanium and its alloys, the possibility of utilizing integrated X-ray intensities for phase analysis was investigated. Power Formula variables were calculated for titanium, and relative areas of three alpha and one beta peak were determined. Recorded X-ray intensities were obtained from a large number of titanium specimens. The recorded intensities were analyzed and the results compared with those from metallographic analysis. The errors in the method arising from the nature of titanium, texture and peak overlapping, were studied and where possible, compensated for by adjusting the method of measurement and calculation.

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X-Ray Diffraction Intensity of Oxife Soild Soultions: Application to Qualitative and Quantitative Phase Analysis

Advances in X-ray Analysis ◽

10.1154/s0376030800012374 ◽

1982 ◽

Vol 26 ◽

pp. 119-128 ◽

Cited By ~ 2

Author(s):

Ronald C. Gehringer ◽

Gregory J. McCarthy ◽

R.G. Garvey ◽

Deane K. Smith

Keyword(s):

Phase Analysis ◽

Solid Solutions ◽

Inorganic Materials ◽

Quantitative Phase Analysis ◽

X Ray Diffraction ◽

X Ray ◽

Cell Parameters ◽

Qualitative And Quantitative ◽

Quantitative Analyses ◽

End Members

Solid solutions are pervasive in minerals and in industrial inorganic materials. The analyst is often called upon to provide qualitative and quantitative X-ray phase analysis for specimens containing solid solutions when all that is available are Powder Diffraction File (PDF) data or commercial standards for the end members. In an earlier paper (1) we presented several examples of substantial errors in accuracy of quantitative analysis that can arise when the crystallinity and composition of the analyte standard do not match those of the analyte in the sample of interest. We recommended that to obtain more accurate quantitative analyses, one should determine the analyte composition (e.g., from XRF on grains seen in a SEM or from comparison of cell parameters with those of the end members) and synthesize an analyte standard with this composition and with a crystallinity approximating that of the analyte (e.g., as determined from peak breadth or α1/ α2 splitting).

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