Recognition, Specificity, Scanning Probe Microscopy and Biomaterials

2001 ◽  
Vol 7 (S2) ◽  
pp. 130-131
Author(s):  
Buddy D. Ratner ◽  
Reto Luginbühll ◽  
Rene Overney ◽  
Michael Garrison ◽  
Thomas Boland
Keyword(s):  
Scanning Probe Microscopy ◽  
Secondary Ion Mass Spectrometry ◽  
Film Structure ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Specific Information ◽  
Tunneling Microscopy ◽  
Probe Microscopy ◽  
Biomaterial Surfaces ◽  
Nucleotide Bases

Although scanning probe microscopy (SPM) can generate images of surface topography, this class of techniques is exceptionally valuable in its ability to provide quantitative and chemically specific information about biomaterial surfaces with high spatial definition. Since engineered biomaterials are designed to deliver chemically defined information, often arrayed in specific geometries, tools that can characterize such materials are needed.A few years ago, we demonstrated how the atomic force microscope (AFM) could precisely distinguish between each of the four nucleotide bases that comprise DNA, measure the nucleotide-nucleotide force of interaction and spatially localize that information on a surface (1). in particular, we found that the nucleotide bases could self-assemble on gold. The assembly process was imaged using scanning tunneling microscopy (STM) and this led to an understanding of the structure of the assembled film. The assembled film structure was further characterized using electron spectroscopy for chemical analysis (ESCA) and secondary ion mass spectrometry (SIMS).

Industrial Applications of Scanning Probe Microscopy

1998 ◽  
Vol 4 (S2) ◽  
pp. 522-523
Author(s):  
S. Magonov
Keyword(s):  
Scanning Probe Microscopy ◽  
High Vacuum ◽  
Sample Surface ◽  
Industrial Applications ◽  
Ultra High Vacuum ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Probe Microscopy ◽  
Force Microscopy

The evolution of scanning tunneling microscopy (STM) into atomic force microscopy (AFM) have led to a family of scanning probe techniques which are widely applied in fundamental research and in industry. Visualization of the atomic- and molecular-scale structures and the possibility of modifying these structures using a sharp probe were demonstrated with the techniques on many materials. These unique capabilities initiated the further development of AFM and related methods generalized as scanning probe microscopy (SPM). The first STM experiments were performed in the clean conditions of ultra-high vacuum and on well-defined conducting or semi-conducting surfaces. These conditions restrict SPM applications to the real world that requires ambient-condition operation on the samples, many of which are insulators. AFM, which is based on the detection of forces between a tiny cantilever carrying a sharp tip and a sample surface, was introduced to satisfy these requirements. High lateral resolution and unique vertical resolution (angstrom scale) are essential AFM features.

Scanning-probe microscopy of polymers

1993 ◽  
Vol 51 ◽  
pp. 874-875
Author(s):  
Darrell H. Reneker ◽  
Rajkumari Patil ◽  
Seog J. Kim ◽  
Vladimir Tsukruk
Keyword(s):  
Scanning Probe Microscopy ◽  
Domain Boundary ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Lamellar Crystal ◽  
Probe Microscopy ◽  
Atomic Force ◽  
Resolution Observation ◽  
Lamellar Crystals

Scanning probe microscopy techniques, particularly atomic force microscopy (AFM) and scanning tunneling microscopy (STM) are finding a rapidly growing number of applications to both synthetic and biological polymers. Segments of individual polymer molecules can often be observed with atom scale resolution. Observation of polymeric objects as large as 100 microns with nanometer resolution is possible with contemporary AFM, although features caused by the convolution of the shape of the sample and the shape of the tip must be recognized and properly interpreted. The vertical resolution of the atomic force microscope readily provides precise data about the heights of molecules, crystals, and other objects.Lamellar crystals of polyethylene are well characterized objects with many features which can be observed with scanning probe microscopes. Figure 1 shows the fold surface near a fold domain boundary of a lamellar crystal of polyethylene, as observed with an AFM. The folded chain crystal is about 15 nm thick.

scholarly journals Scanning Probe Microscopy: A Rapidly Emerging Instrumental Method

1994 ◽  
Vol 2 (6) ◽  
pp. 16-17
Author(s):  
Daphna R. Yaniv ◽  
B.L. Ramakrishna ◽  
William S. Glaunsinger
Keyword(s):  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Instrumental Method ◽  
Tunneling Microscopy ◽  
New Era ◽  
Probe Microscopy ◽  
Structures And Properties ◽  
Close Proximity ◽  
Electrochemical Control

Scanning Probe Microscopy (SPM) was introduced to the scientific community twelve years ago, and its inventors (Binning and Rohrer) were awarded the Nobel Prize in Physics in 1986. In the last decade it expanded from a single technique limited to a single medium of imaging, namely ultrahigh vacuum (UHV) scanning tunneling microscopy (STM), to an array of techniques operating in essentially any medium (vacuum, air or solution with and without electrochemical control). In all of these techniques, a probe, positioned in close proximity to the sample, scans its surface and monitors some property that is related to the surface topography or to any other surface property. Not only can surface structures and properties be investigated at ultrahigh resolution with SPM, but surfaces can also be modified by design. The latter capability is ushering in a new era of nanotechnology.

Germanium Nanostructures on Silicon Observed by Scanning Probe Microscopy

MRS Bulletin ◽  
2004 ◽  
Vol 29 (7) ◽  
pp. 484-487 ◽  
Author(s):  
Masahiko Tomitori ◽  
Toyoko Arai
Keyword(s):  
Scanning Probe Microscopy ◽  
Film Growth ◽  
Three Dimensional ◽  
Layer Growth ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Layer By Layer ◽  
Tunneling Microscopy ◽  
Probe Microscopy ◽  
History Of

AbstractScanning tunneling microscopy and noncontact atomic force microscopy have been used to observe germanium growth on Si(001) and Si(111). The atomically resolved images provide invaluable information on heteroepitaxial film growth from the viewpoints of both industrial application and basic science. We briefly review the history of characterizing heteroepitaxial elemental semiconductor systems by means of scanning probe microscopy (SPM), where the Stranski–Krastanov growth mode can be observed on the atomic scale:the detailed phase transition from layer-by-layer growth to three-dimensional cluster growth was elucidated by the use of SPM. In addition, we comment on the potential of SPM for examining the spectroscopic aspects of heteroepitaxial film growth, through the use of SPM tips with well-defined facets.

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