scholarly journals An integrated Silicon Drift Detector System for FEI Schottky Field Emission Transmission Electron Microscopes

2009 ◽  
Vol 15 (S2) ◽  
pp. 208-209 ◽  
Author(s):  
HS von Harrach ◽  
P Dona ◽  
B Freitag ◽  
H Soltau ◽  
A Niculae ◽  
...  
Keyword(s):  
Field Emission ◽  
Detector System ◽  
Silicon Drift Detector ◽  
Transmission Electron ◽  
Electron Microscopes

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

scholarly journals An integrated multiple silicon drift detector system for transmission electron microscopes

2010 ◽  
Vol 241 ◽  
pp. 012015 ◽  
Author(s):  
H S von Harrach ◽  
P Dona ◽  
B Freitag ◽  
H Soltau ◽  
A Niculae ◽  
...  
Keyword(s):  
Detector System ◽  
Silicon Drift Detector ◽  
Transmission Electron ◽  
Electron Microscopes

The Observation of NBC Precipitates In Steels In The Nanometer Range Using A Field Emission Gun Scanning Electron Microscope

1997 ◽  
Vol 3 (S2) ◽  
pp. 1243-1244 ◽  
Author(s):  
Raynald Gauvin ◽  
Steve Yue
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Field Emission ◽  
Incident Electron Energy ◽  
Beam Diameter ◽  
Probe Diameter ◽  
Transmission Electron ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes ◽  
Scanning Electron

The observation of microstructural features smaller than 300 nm is generally performed using Transmission Electron Microscopy (TEM) because conventional Scanning Electron Microscopes (SEM) do not have the resolution to image such small phases. Since the early 1990’s, a new generation of microscopes is now available on the market. These are the Field Emission Gun Scanning Electron Microscope with a virtual secondary electron detector. The field emission gun gives a higher brightness than those obtained using conventional electron filaments allowing enough electrons to be collected to operate the microscope with incident electron energy, E0, below 5 keV with probe diameter smaller than 5 nm. At 1 keV, the electron range is 60 nm in aluminum and 10 nm in iron (computed using the CASINO program). Since the electron beam diameter is smaller than 5 nm at 1 keV, the resolution of these microscopes becomes closer to that of TEM.

Development of a 1-MV Field-Emission Electron Microscope III. Electron Optical Design and Development of Field-Emission Electron Gun

2000 ◽  
Vol 6 (S2) ◽  
pp. 1142-1143
Author(s):  
Takaho Yoshida ◽  
Takeshi Kawasaki ◽  
Junji Endo ◽  
Tadao Furutsu ◽  
Isao Matsui ◽  
...  
Keyword(s):  
Electron Beam ◽  
Field Emission ◽  
Optical Design ◽  
Electron Gun ◽  
Electron Holography ◽  
Optimized Design ◽  
Emission Electron ◽  
Transmission Electron ◽  
Electron Microscopes ◽  
Aharonov Bohm

Bright and coherent electron beams have been opening new frontiers in science and technology. So far, we have developed several field-emission transmission electron microscopes (FE-TEM) with increasing accelerating voltages to provide higher beam brightness. By using a 200-kV FE-TEM and electron holography techniques, we directly confirmed the Aharonov-Bohm effect. A 350-kV FE-TEM equipped with a low-temperature specimen stage enabled us to observe moving vortices in superconductors.2 Most Recently, we have developed a new 1-MV FE-TEM with a newly designed FE gun to obtain an even brighter and more coherent electron beam.Electron beam brightness, Br, defined in Figure 1, is suitable for measuring the performance of electron guns, since both lens aberrations and mechanical/electrical vibrations contribute to a decrease in beam brightness, and beam coherency is proportional to (Br)1/2. Therefore, we optimized design of the illuminating system and its operation by maximizing the electron beam brightness.

Holographic contrast transfer theory

1992 ◽  
Vol 50 (2) ◽  
pp. 984-985
Author(s):  
R. Plass ◽  
L. D. Marks
Keyword(s):  
Electron Beam ◽  
Transfer Function ◽  
Field Emission ◽  
Electron Holography ◽  
Contrast Transfer Function ◽  
Beam Focusing ◽  
Emission Electron ◽  
Transmission Electron ◽  
Electron Microscopes ◽  
Image Position

With the advent of reliable cold field emission transmission electron microscopes there is substantial interest in using the amplitude and phase information recorded in electron holograms to optically or numerically correct for the coherent aberrations of transmission electron microscopes. However electron holography cannot compensate for incoherent aberrations. The derivation of the contrast transfer function for off axis electron holography in this paper shows there is no fundamental improvement in resolution for electron holography over conventional transmission electron microscopy.Evaluating the contrast transfer function involves mathematically following an electron beam through a field emission electron microscope set up for off axis electron holography. Due to the high coherence of the field emission electron beam coherent aberrations caused by the pre-specimen beam focusing system must be accounted for. Starting with a spacial frequency distribution, C(v), for the electron beam leaving the gun, the electron beam is limited by the condenser aperture and coherently aberrated by the condenser lens and objective pre-field as it passes to the specimen region:

Development of a 1MV-Field-Emission Electron Microscope I. Instrument

2000 ◽  
Vol 6 (S2) ◽  
pp. 1138-1139
Author(s):  
I. Matsui ◽  
T. Katsuta ◽  
T. Kawasaki ◽  
S. Hayashi ◽  
T. Furutsu ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Field Emission ◽  
Transmission Electron Microscope ◽  
Scanning Transmission Electron Microscope ◽  
Electron Holography ◽  
Lorentz Microscopy ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Resolution Imaging ◽  
Electron Microscopes

We have developed 100-kV, 200-kV, and 350-kV cold-field-emission transmission electron microscopes (FE-TEMs) successively up to this time. Using these instruments, we have been studying the magnetic structure of materials, high-resolution imaging by electron holography, and dynamic observation of the vortex in superconductors by Lorentz microscopy. To make more progress in our research, we need a better electron beam in terms of coherency, beam brightness, and penetration. Here, we report a new lMV-cold-field-emission transmission electron microscope we have developed. Historically, the pioneering projects on a lMV-field-emission scanning transmission electron microscope (FE-STEM) (Zeitler and Crewe, 1974) and a 1.6MV FE-STEM (Jouffrey et al., 1984) have been reported. In 1988, Maruse and Shimoyama obtained a lMV-field-emission beam using their 1.25MV-STEM connected to a field-emission gun. Since then, continuous improvements in beam brightness has been made.The target specifications of our 1 MV-cold-field-emission TEM (H-1000FT) are as follows: Acceleration voltage: 1MV, high-voltage stability :

scholarly journals Evolution and Comparison of Electron Sources

1993 ◽  
Vol 1 (4) ◽  
pp. 16-17
Author(s):  
Doug Rathkey
Keyword(s):  
Cathode Material ◽  
Field Emission ◽  
Electron Beam Lithography ◽  
Electron Sources ◽  
Thermionic Cathodes ◽  
Transmission Electron ◽  
Electron Microscopes ◽  
Field Emission Cathodes ◽  
Scanning Electron Microscopes ◽  
Scanning Electron

Over the years, we've seen major developments in electron source technologies in response to the demands for better performance. This article presents a brief overview of the cathode technologies in use today.Two types of electron sources are used in commercially available scanning electron microscopes (SEMs), transmission electron microscopes (TEMs), scanning Auger microprobes, and electron beam lithography systems: thermionic and field emission electron cathodes. Thermionic cathodes reiease electrons from the cathode material when they are heated while field emission cathodes rely on a high electric field to draw electrons from the cathode material.

Hitachi's Development of Cold-Field Emission Scanning Transmission Electron Microscopes

2009 ◽  
pp. 123-186 ◽  
Author(s):  
Hiromi Inada ◽  
Hiroshi Kakibayashi ◽  
Shigeto Isakozawa ◽  
Takahito Hashimoto ◽  
Toshie Yaguchi ◽  
...  
Keyword(s):  
Field Emission ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Electron Microscopes

scholarly journals STEM Imaging of Lattice Fringes and beyond in a UHR In-Lens Field-Emission SEM

2007 ◽  
Vol 15 (2) ◽  
pp. 12-17 ◽  
Author(s):  
Vinh Van Ngo ◽  
Mike Hernandez ◽  
Bill Roth ◽  
David C Joy
Keyword(s):  
Field Emission ◽  
Noise Figure ◽  
Contrast Imaging ◽  
Multi Wall Carbon Nanotubes ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Graphite Lattice ◽  
Electron Microscopes ◽  
Fft Algorithms ◽  
Atomic Lattices

The phase-contrast imaging of atomic lattices has now become commonplace for both Transmission Electron Microscopes (TEM) and Scanning Transmission Electron Microscopes (STEMs). Recently, however, bright-field STEM images of multi-wall carbon nanotubes (MWCNTs) recorded from an ultra-high resolution (UHR) in-lens field-emission scanning electron microscope (FE-SEM) operating at 30keV have also demonstrated lattice fringe resolution. One example of such an image containing multiple examples of fringe detail is shown in figure 1. The carbon lattice fringes were analyzed and their origin confirmed by the application of the FFT algorithms in the SMART image analysis program. The resulting power spectrum after thresholding to remove background noise (Figure 2) confirms that phase detail in the image extends down to about 5 Angstroms (0.5nm) and that well defined diffraction spots corresponding to a spacing of 3.4 Angstroms (0.34nm) generated by the (002) basal plane spacing of the graphite lattice are present.

Sign in / Sign up

Export Citation Format

Share Document